Chemical characterization of the superficial layers of deuterium-implanted cadmium telluride

The influence of deuterium implantation by a means of Kaufmann source on the surface and surface region of a cadmium telluride single crystal has been investigated by X-ray photoelectron spectroscopy. The results show that superficial layers of cadmium telluride are removed leaving a surface depleted in tellurium. Deuterium implantation protects the surface from further oxidation. (U.K.)