Published November 1986
| Version v1
Journal article
New dual-ion irradiation station at the University of Tokyo
- 1. Tokyo Univ. (Japan). Dept. of Materials Science
- 2. Tokyo Univ. (Japan). Faculty of Engineering
Description
The High-fluence Irradiation Test (HIT) facility of the University of Tokyo, under construction since 1983, was completed in the fall of 1985 with the assembly of the target station for dual-ion irradiation. The HIT facility was composed of two types of accelerators, viz., a Van de Graaff accelerator for light ions and a Tandem accelerator (Tandetron) for heavy ions. The target stations have some new and advantageous features for the measurement of irradiation parameters, e.g., ion-beam profile monitoring. The constitution of the dual-ion irradiation system of HIT is described together with a brief indication of the test results of a dual-ion experiment. (orig.)
Additional details
Publishing Information
- Journal Title
- J. Nucl. Mater.
- Journal Volume
- 141-143
- Journal Issue
- pt.B
- Series
- J. Nucl. Mater.
- Journal Page Range
- 794-798
- ISSN
- 0022-3115
- CODEN
- JNUMA
Conference
- Title
- 2. international conference on fusion reactor materials (ICFRM-2).
- Dates
- 13-17 Apr 1986.
- Place
- Chicago, IL (USA).
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- Netherlands
- INIS RN
- 18067056
- Subject category
- S70: PLASMA PHYSICS AND FUSION TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- BEAM PROFILES; BEAM SCANNERS; HELIUM IONS; HIGH TEMPERATURE; ION BEAMS; IRRADIATION DEVICES; KEV RANGE 100-1000; MEV RANGE 01-10; NICKEL; NICKEL IONS; TANDEM ELECTROSTATIC ACCELERAT; TARGET CHAMBERS; THERMONUCLEAR REACTOR MATERIAL; TRANSMISSION ELECTRON MICROSCO; VAN DE GRAAFF ACCELERATORS
- Descriptors DEC
- ACCELERATOR FACILITIES; ACCELERATORS; ATOMIC IONS; BEAM MONITORS; BEAMS; CHARGED PARTICLES; ELECTRON MICROSCOPY; ELECTROSTATIC ACCELERATORS; ELEMENTS; ENERGY RANGE; IONS; KEV RANGE; MATERIALS; MEASURING INSTRUMENTS; METALS; MEV RANGE; MICROSCOPY; MONITORS; TRANSITION ELEMENTS