Published September 15, 1982 | Version v1
Journal article

Geometrical aberrations in curved Bragg crystal spectrometers

  • 1. Joint Inst. for Nuclear Research, Dubna (USSR). Dept. of New Acceleration Methods

Description

Under some simplifying assumptions, the line profile of a reflection of a monochromatic line observed with a curved crystal spectrometer for an extended source and curved crystal geometry is derived. In particular, the effect of the finite dimensions of source and crystal is discussed for Johann and Johansson spectrometers. Analytical and numerical studies are provided. It is shown that some parameters produce line asymmetries and shifts of the reflected line's center of gravity. For single non-zero dimensions, analytical dependences for the shifts of the line's center of gravity are derived. From numerical calculations the change of the reflected amplitude and the peak width are obtained. (orig.)

Additional details

Publishing Information

Journal Title
Nucl. Instrum. Methods Phys. Res.
Journal Volume
200
Journal Issue
2/3
Series
Nucl. Instrum. Methods Phys. Res.
Journal Page Range
481-490
ISSN
0029-554X

INIS

Country of Publication
Netherlands
Country of Input or Organization
Netherlands
INIS RN
14720714
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Descriptors DEI
BRAGG REFLECTION; CRYSTALS; GEOMETRY; X-RAY DIFFRACTION; X-RAY SPECTROMETERS
Descriptors DEC
COHERENT SCATTERING; DIFFRACTION; MATHEMATICS; MEASURING INSTRUMENTS; REFLECTION; SCATTERING; SPECTROMETERS