Published July 1991
| Version v1
Journal article
A capacitive displacement monitor system for the DELPHI microvertex detector
Creators
- 1. Milan Univ. (Italy)
- 2. INFN, Milan (Italy)
Description
We describe the design of a Displacement Monitor System relying on local capacitance measurements. This system controls the relative position of the Delphi microstrip Vertex Detector at LEP. Results from the first months of data taking are presented. They show displacements are effectively monitored with the expected micron precision. (orig.)
Additional details
Publishing Information
- Journal Title
- Nuclear Physics. B, Proceedings Supplements
- Journal Volume
- 23A
- Series
- Nucl. Phys., B Proc. Suppl.
- Journal Page Range
- 448-456
- ISSN
- 0920-5632
- CODEN
- NPBSE
Conference
- Title
- 2. international conference on advanced technology and particle physics.
- Dates
- 11-15 Jun 1990.
- Place
- Como (Italy).
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- Netherlands
- INIS RN
- 23002470
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ACCURACY; CALIBRATION; DISPLACEMENT GAGES; LEP STORAGE RINGS; MONITORS; POSITION SENSITIVE DETECTORS; SI SEMICONDUCTOR DETECTORS
- Descriptors DEC
- MEASURING INSTRUMENTS; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS; STORAGE RINGS