Coherent and incoherent Thomson scattering on an argon/hydrogen microwave plasma torch with transient behaviour
- 1. Department of Physical Electronics at the Faculty of Science, Masaryk University, Kotlarska 2, 61137 Brno (Czech Republic)
- 2. RG Plasma Technologies, CEITEC - Central European Institute of Technology, Masaryk University, Purkyňova 123, 612 00 Brno (Czech Republic)
- 3. Institute for Experimental Physics II, Ruhr-Universität Bochum, 44780 Bochum (Germany)
- 4. Universite Libre de Bruxelles (ULB) 50 av. F.D. Roosevelt, 1050 Brussels (Belgium)
- 5. Department of Applied Physics, Eindhoven University of Technology, PO Box 513, 5600 MB, Eindhoven (Netherlands)
Description
A new method of processing time-integrated coherent Thomson scattering spectra is presented, which provides not only the electron density and temperature but also information about the transient behaviour of the plasma. Therefore, it is an alternative to single-shot Thomson scattering measurements as long as the scattering is coherent. The method is applied to a microwave plasma torch operating in argon or a mixture of argon with hydrogen at atmospheric pressure. Electron densities up to m−3 (ionization degree above 10−3) were observed, which is more than two times higher than presented in earlier works on comparable discharges. Additionally, a parametric study with respect to the argon/hydrogen ratio and the input power was carried out and the results are discussed together with earlier Stark broadening measurements on the same plasma. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/0963-0252/25/5/055018Additional details
Identifiers
Publishing Information
- Journal Title
- Plasma Sources Science and Technology
- Journal Volume
- 25
- Journal Issue
- 5
- Journal Page Range
- [13 p.]
- ISSN
- 0963-0252
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 51036576
- Subject category
- S70: PLASMA PHYSICS AND FUSION TECHNOLOGY;
- Descriptors DEI
- ARGON; ATMOSPHERIC PRESSURE; ELECTRON DENSITY; HYDROGEN; IONIZATION; MICROWAVE RADIATION; MIXTURES; PARAMETRIC ANALYSIS; PLASMA; PROCESSING; THOMSON SCATTERING
- Descriptors DEC
- DISPERSIONS; ELECTROMAGNETIC RADIATION; ELEMENTS; FLUIDS; GASES; INELASTIC SCATTERING; NONMETALS; RADIATIONS; RARE GASES; SCATTERING