Published March 21, 2005
| Version v1
Journal article
Spatial growth rate and field profiles of symmetric mode in a rod dielectric Cerenkov maser with a magnetized plasma column
Creators
- 1. Physics Department and Laser Research Institute of Shahid Beheshti University, Evin, Tehran (Iran, Islamic Republic of) and Institute for Studies in Theoretical Physics, 19395-3351 Tehran (Iran, Islamic Republic of)
- 2. Physics Department, Kashan University, Blvd. Ravand, Kashan (Iran, Islamic Republic of)
Description
By numerically solving the exact dispersion equation, the dispersion relation of symmetrical TM waves propagating in a Cerenkov maser including a thin annular relativistic electron beam (TAREB), a strongly magnetized plasma column, and a dielectric rod is investigated. The effects of accelerating voltage, radii of TAREB and plasma column as well, on the frequency spectra and spatial growth-rate coefficient are presented. The axial electric field profiles during the wave amplification and the conditions under which the spatial growth rates are maximum are presented
Additional details
Identifiers
- DOI
- 10.1016/j.physleta.2004.12.094;
- PII
- S0375-9601(05)00008-3;
Publishing Information
- Journal Title
- Physics Letters. A
- Journal Volume
- 336
- Journal Issue
- 6
- Journal Page Range
- p. 477-489
- ISSN
- 0375-9601
- CODEN
- PYLAAG
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 37033889
- Subject category
- S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
- Descriptors DEI
- DIELECTRIC MATERIALS; DISPERSION RELATIONS; ELECTRIC FIELDS; ELECTRIC POTENTIAL; ELECTRON BEAMS; EQUATIONS; EXACT SOLUTIONS; MASERS; PLASMA; RELATIVISTIC RANGE; RODS
- Descriptors DEC
- AMPLIFIERS; BEAMS; ELECTRONIC EQUIPMENT; ENERGY RANGE; EQUIPMENT; LEPTON BEAMS; MATERIALS; MATHEMATICAL SOLUTIONS; MICROWAVE AMPLIFIERS; MICROWAVE EQUIPMENT; PARTICLE BEAMS
Optional Information
- Copyright
- Copyright (c) 2005 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.