Published July 1, 2009
| Version v1
Miscellaneous
Improved Performance of a Commercial SDD for X-ray Microanalysis
Creators
- 1. Oak Ridge National Lab., TN (United States)
Description
The performance of a silicon drift detector (SDD) is evaluated for SEM-based x-ray microanalysis. The throughput, spectral fidelity and energy resolution are measured as a function of input count rate and detector time constant for two pulse processors. Post-acquisition processing to minimize the effects of pulse pile-up is discussed
Availability note (English)
Available from Oak Ridge National Laboratory, Oak Ridge, TN (US)Additional details
Publishing Information
- Imprint Pagination
- 2 p.
Conference
- Title
- Microscopy and Microanalysis 2009
- Dates
- 26-30 Jul 2009
- Place
- Richmond, VA (United States)
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 40089012
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Resource subtype / Literary indicator
- Conference, Non-conventional Literature
- Descriptors DEI
- ENERGY RESOLUTION; MICROANALYSIS; PERFORMANCE; SCANNING ELECTRON MICROSCOPY; SI SEMICONDUCTOR DETECTORS; X-RAY DETECTION
- Descriptors DEC
- DETECTION; ELECTRON MICROSCOPY; MEASURING INSTRUMENTS; MICROSCOPY; RADIATION DETECTION; RADIATION DETECTORS; RESOLUTION; SEMICONDUCTOR DETECTORS
Optional Information
- Contract/Grant/Project number
- KC0210010; ERKCM03; AC05-00OR22725
- Notes
- pages 560CD-561CD
- Funding organization
- SC USDOE - Office of Science (Seychelles) (US)