High-resolution in-source laser spectroscopy in perpendicular geometry
Creators
- 1. Universität Mainz, Institut für Physik (Germany)
- 2. Helmholtz-Institut Mainz (Germany)
- 3. Universität Mainz, Institut für Kernchemie (Germany)
Description
Operation of the novel laser ion source unit LIST (Laser Ion Source and Trap), operating at the on-line radioactive ion beam facility ISOLDE at CERN allowed for the production of ultra-pure beams of exotic isotopes far-off stability as well as direct isobar-free laser spectroscopy, giving access to the study of atomic and nuclear properties of so far inaccessible nuclides. We present a specific upgrade and adaption of the LIST targeted for high resolution spectroscopy with a Doppler-reduced perpendicular atom - laser beam geometry. With this PI-LIST (Perpendicularly Illuminated Laser Ion Source and Trap) setup, experimental linewidths below 100 MHz could be demonstrated in optical laser spectroscopy off-line, applying a pulsed injection-locked high repetition rate Ti:sapphire laser. A dual repeller configuration ensured highest suppression of isobaric interferences and almost background-free measurements on small samples in the order of 1011 atoms.
Additional details
Identifiers
Publishing Information
- Journal Title
- Hyperfine Interactions
- Journal Volume
- 238
- Journal Issue
- 1
- Journal Page Range
- p. 1-9
- ISSN
- 0304-3843
- CODEN
- HYINDN
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 48063939
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ATOMS; CERN; CONFIGURATION; DOPPLER EFFECT; INHIBITION; INJECTION; INTERFERENCE; ION SOURCES; IONS; ISOTOPES; LASER SPECTROSCOPY; LINE WIDTHS; NUCLEAR PROPERTIES; PULSES; RADIOACTIVE ION BEAMS; RESOLUTION; SAPPHIRE; STABILITY; TRAPS
- Descriptors DEC
- BEAMS; CHARGED PARTICLES; CORUNDUM; INTAKE; INTERNATIONAL ORGANIZATIONS; ION BEAMS; MINERALS; OXIDE MINERALS; SPECTROSCOPY
Optional Information
- Copyright
- Copyright (c) 2017 Springer International Publishing Switzerland