Published 2014 | Version v1
Report Open

Detection system of the COMBAS fragment separator

Creators

  • 1. Ob''edinennyj Inst. Yadernykh Issledovanij, Dubna (Russian Federation)
  • 2. Inst. Yadernykh Issledovanij, NAN Ukrainy, Kiev (Ukraine)
  • 3. OIYaI, Dubna (Russian Federation)
  • 4. Khar'kovskij Natsional'nyj Univ. im. V.N.Karazina, Khar'kov (Ukraine)
  • 5. Inst. Yadernykh Issledovanij, NAN Ukrainy (Ukraine)
  • 6. Tsentr Yadernykh Issledovanij, Mongol'skij Gosudarstvennyj Univ., Ulan-Bator (Mongolia)

Description

The results of design and testing of multi-detector telescope (ΔE1, ΔE2, E) are given. The compact telescope consists of 32-strip Si ΔE-detectors and CsI/Tl E-scintillation detectors of high granularity (nine modules) and allows one to obtain timing signal from Si detectors for TOF measurements. The single channel and 32-channel charge-sensitive preamplifiers were developed and manufactured to serve the Si ΔE-detectors and CsI/Tl scintillation E-detectors with high efficiency and sensitivity. Unambiguous A and Z identification of reaction products, produced in the 40Ar (35 MeV/nucleon) + 9Be reaction system, is implemented.

Availability note (English)

Also available online: http://www1.jinr.ru/Preprints/2014/020(P13-2014-20).pdf

Files

45110614.pdf

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Additional details

Additional titles

Original title (Russian)
Детектирующая система фрагмент-сепаратора KOMBAS

Identifiers

URL
http://www1.jinr.ru/Preprints/2014/020(P13-2014-20).pdf;

Publishing Information

Imprint Pagination
18 p.
Report number
JINR-R--13-2014-20

INIS

Country of Publication
Joint Institute for Nuclear Research (JINR)
Country of Input or Organization
Joint Institute for Nuclear Research (JINR)
INIS RN
45110614
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Descriptors DEI
PERFORMANCE TESTING; PREAMPLIFIERS; SCINTILLATOR-PHOTODIODE DETECTORS; SI MICROSTRIP DETECTORS; SPECIFICATIONS; TELESCOPE COUNTERS; TIME-OF-FLIGHT METHOD
Descriptors DEC
AMPLIFIERS; ELECTRONIC EQUIPMENT; EQUIPMENT; MEASURING INSTRUMENTS; RADIATION DETECTORS; SCINTILLATION COUNTERS; SEMICONDUCTOR DETECTORS; SI SEMICONDUCTOR DETECTORS; TESTING

Optional Information

Notes
7 refs., 17 figs., Submitted to the journal, Pribory i Tekhnika Ehksperimenta