TEM observations of Al72Ni12Co16 decagonal quasicrystal subjected to high-temperature indentation
- 1. Department of Materials Science and Engineering, Akita University, Akita 010-8502 (Japan)
- 2. Akita Prefecture Industrial Technology Center, Akita 010-1623 (Japan)
- 3. National Institute for Materials Science, Tsukuba 305-0047 (Japan)
Description
The effect of high-temperature indentation testing on the microstructural change of a single-grained Al72Ni12Co16 decagonal quasicrystal (d-QC) has been investigated by transmission electron diffraction and microscopy (TEM) technique. A definite surface normal to the 10-fold axis of the d-QC was subjected to Vickers indentation test at an elevated temperature of 800 deg. C with a load of 1 kgf. The TEM investigation of this sample has evidently shown that there are specific types of defects densely distributed in the indented-region, such as grain-boundaries, dislocations and phason-related defects. Furthermore, high-resolution electron microscopy observations have revealed the widespread distribution of nanocrystalline domains in the indented-region, where groups of decagonal atom clusters have a periodic arrangement to form a rhombic lattice. On the basis of these observations, possible deformation mechanisms of the d-QC during high-temperature indentation will be discussed
Additional details
Identifiers
- DOI
- 10.1016/j.msea.2005.05.048;
- PII
- S0921-5093(05)00490-9;
Publishing Information
- Journal Title
- Materials Science and Engineering. A, Structural Materials: Properties, Microstructure and Processing
- Journal Volume
- 403
- Journal Issue
- 1-2
- Journal Page Range
- p. 241-248
- ISSN
- 0921-5093
- CODEN
- MSAPE3
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 38076139
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- CRYSTALS; DEFECTS; DEFORMATION; DISLOCATIONS; ELECTRON DIFFRACTION; ELECTRON MICROSCOPY; GRAIN BOUNDARIES; MATERIALS TESTING; NANOSTRUCTURES; SPATIAL RESOLUTION; TEMPERATURE DEPENDENCE
- Descriptors DEC
- COHERENT SCATTERING; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; DIFFRACTION; LINE DEFECTS; MICROSCOPY; MICROSTRUCTURE; RESOLUTION; SCATTERING; TESTING
Optional Information
- Copyright
- Copyright (c) 2005 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.