Published January 6, 2014
| Version v1
Journal article
p-type GaN grown by phase shift epitaxy
- 1. Department of Electrical Engineering and Computing Systems, University of Cincinnati, Cincinnati, Ohio 45221-0030 (United States)
- 2. Nitronex Corporation, Raleigh, North Carolina 27606 (United States)
- 3. Department of Electrical and Computer Engineering, Duke University, Durham, North Carolina 27708 (United States)
Description
Phase shift epitaxy (PSE) is a periodic growth scheme, which desynchronizes host material growth process from dopant incorporation, allowing independent optimization. p-type doping of GaN with Mg by PSE is accomplished with molecular beam epitaxy by periodic shutter action (in order to iterate between Ga- and N-rich surface conditions) and by adjusting time delays between dopant and Ga shutters. Optimum PSE growth was obtained by turning on the Mg flux in the N-rich condition. This suppresses Mg self-compensation at high Mg concentration and produces fairly high hole concentrations (2.4 × 1018 cm−3)
Additional details
Identifiers
- DOI
- 10.1063/1.4861058;
Publishing Information
- Journal Title
- Applied Physics Letters
- Journal Volume
- 104
- Journal Issue
- 1
- Journal Page Range
- p. 012108-012108.5
- ISSN
- 0003-6951
- CODEN
- APPLAB
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 45078339
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- CRYSTAL GROWTH; GALLIUM NITRIDES; HOLES; MOLECULAR BEAM EPITAXY; PHASE SHIFT
- Descriptors DEC
- CRYSTAL GROWTH METHODS; EPITAXY; GALLIUM COMPOUNDS; NITRIDES; NITROGEN COMPOUNDS; PNICTIDES
Optional Information
- Notes
- (c) 2014 AIP Publishing LLC