Published November 2004
| Version v1
Journal article
The application of photon, electron and proton induced X-ray analysis for the identification and characterisation of medieval silver coins
Creators
Description
Photons, electrons and protons beams applied to the scientific investigation of archaeological materials provide complementary information for characterising the state of preservation and the provenance of the objects. Investigations were carried out on medieval silver coins of the 'Friesacher Pfennig' and the 'Tiroler Kreuzer' from the Kunsthistorisches Museum Vienna and the Oesterreichische Nationalbank. Techniques employed were EDXRF, SEM/EDX and PIXE. By determining the trace elements of the alloys it was possible to assign coins to their mint. The results outline advantages and disadvantages of EDXRF, SEM/EDX and PIXE when applied to corroded objects
Additional details
Identifiers
- DOI
- 10.1016/j.nimb.2004.03.084;
- PII
- S0168583X04007438;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
- Journal Volume
- 226
- Journal Issue
- 1-2
- Journal Page Range
- p. 172-178
- ISSN
- 0168-583X
- CODEN
- NIMBEU
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 36020666
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Descriptors DEI
- ALLOYS; CULTURAL OBJECTS; ELECTRON BEAMS; ELECTRON REACTIONS; MULTI-ELEMENT ANALYSIS; NUCLEAR REACTION ANALYSIS; PIXE ANALYSIS; PRESERVATION; PROTON BEAMS; PROTON REACTIONS; QUANTITATIVE CHEMICAL ANALYSIS; SCANNING ELECTRON MICROSCOPY; SILVER; TRACE AMOUNTS
- Descriptors DEC
- BARYON REACTIONS; BEAMS; CHARGED-PARTICLE REACTIONS; CHEMICAL ANALYSIS; ELECTRON MICROSCOPY; ELEMENTS; HADRON REACTIONS; LEPTON BEAMS; LEPTON REACTIONS; METALS; MICROSCOPY; NONDESTRUCTIVE ANALYSIS; NUCLEAR REACTIONS; NUCLEON BEAMS; NUCLEON REACTIONS; PARTICLE BEAMS; TRANSITION ELEMENTS; X-RAY EMISSION ANALYSIS
Optional Information
- Copyright
- Copyright (c) 2004 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.