Published March 13, 2024 | Version v1
Journal article

Self-energy corrections to zone-edge acoustic phonons in monolayer and bilayer WS2

  • 1. Department of Physics, College of Physical Science and Technology, Xiamen University, Xiamen 361005, China
  • 2. Joint School of National University of Singapore and Tianjin University, International Joint Institute of Tianjin University, Fuzhou 350207, China
  • 3. School of Physics and Key Laboratory of MEMS of the Ministry of Education, Southeast University, Nanjing 211189, China
  • 4. State Key Laboratory of Optoelectronic Materials and Technologies, Guangdong Provincial Key Laboratory of Magnetoelectric Physics and Devices, Centre for Physical Mechanics and Biophysics, School of Physics, Sun Yat-sen University, Guangzhou 510275, China

Description

The self-energy corrections to phonons have mostly been observed for modes with zone-center (q=0) wave vectors. Here, we investigated the self-energy corrections to phonons in ionic-liquid-gated semiconductors, i.e., monolayer and bilayer WS2, experimentally. Apart from the previously observed A1g(Γ) mode renormalization by Raman spectroscopy, we additionally discovered that the zone-edge longitudinal acoustic (LA(M)) phonon also softened under finite electron doping. This observed renormalization effect arises from the LA(M) phonon-assisted electron scattering between the K and Q valleys in the conduction bands, indicating the nonadiabatic self-energy corrections dominate, different from the A1g(Γ) mode. The self-energy corrections of the two modes both depend on layer configurations. Our findings suggest that WS2 and other similar two-dimensional materials are intriguing playgrounds to study the electron-phonon interactions and valley-related physics.

Additional details

Identifiers

DOI
10.1103/PhysRevB.109.L121202;
Crossref Funder ID
10.13039/501100001809; 10.13039/501100002855; 10.13039/501100003453; 10.13039/501100003392; 10.13039/501100004608;

Publishing Information

Journal Title
Physical Review B
Journal Volume
109
Journal Issue
12
Journal Page Range
6 pgs.
ISSN
1550-235X