X-ray fluorescence analysis of U in solution using a double correction for background-scattered radiation

The application is discussed of X-ray fluorescence analysis in the study of geological materials, mainly in the determination of uranium and other elements in the liquid phase. The method guarantees sensitivity, accuracy and selectivity of determination and the possibility of automating the measuring and evaluation processes. A method of double correction for radiation scattered in the background was used to improve the accuracy of results, this in view of considerable differences in the contents of soluble components in the solutions. (J.C.)