Published May 30, 2014 | Version v1
Journal article

Characterization of ethylcellulose and hydroxypropyl methylcellulose thin films deposited by matrix-assisted pulsed laser evaporation

  • 1. National Institute for Lasers, Plasma and Radiation Physics, PO Box MG-36, Magurele, RO-077125 Bucharest (Romania)
  • 2. Paul Scherrer Institut, General Energy Research Department, 5232 Villigen PSI (Switzerland)

Description

In this study is reported the deposition of hydroxypropyl methylcellulose (HPMC) and ethylcellulose (EC) by matrix-assisted pulsed laser evaporation (MAPLE). Both HPMC and EC were deposited on silicon substrates using a Nd:YAG laser (266 nm, 5 ns laser pulse and 10 Hz repetition rate) and then characterized by atomic force microscopy and Fourier transform infrared spectroscopy. It was found that for laser fluences up to 450 mJ/cm2 the structure of the deposited HPMC and EC polymer in the thin film resembles to the bulk. Morphological investigations reveal island features on the surface of the EC thin films, and pores onto the HPMC polymer films. The obtained results indicate that MAPLE may be an alternative technique for the fabrication of new systems with desired drug release profile.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.apsusc.2013.11.058

Additional details

Identifiers

DOI
10.1016/j.apsusc.2013.11.058;
PII
S0169-4332(13)02136-3;

Publishing Information

Journal Title
Applied Surface Science
Journal Volume
302
Journal Page Range
p. 87-91
ISSN
0169-4332
CODEN
ASUSEE

Conference

Title
E-MRS 2013 symposium V on laser material interactions for micro- and nano-applications
Dates
27-31 May 2013
Place
Strasbourg (France)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
46023007
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ATOMIC FORCE MICROSCOPY; DEPOSITION; EVAPORATION; FOURIER TRANSFORM SPECTROMETERS; NEODYMIUM LASERS; POLYMERS; PULSES; SILICON; SUBSTRATES; SURFACES; THIN FILMS
Descriptors DEC
ELEMENTS; FILMS; LASERS; MEASURING INSTRUMENTS; MICROSCOPY; PHASE TRANSFORMATIONS; SEMIMETALS; SOLID STATE LASERS; SPECTROMETERS

Optional Information

Copyright
Copyright (c) 2013 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.