Characterization of ethylcellulose and hydroxypropyl methylcellulose thin films deposited by matrix-assisted pulsed laser evaporation
- 1. National Institute for Lasers, Plasma and Radiation Physics, PO Box MG-36, Magurele, RO-077125 Bucharest (Romania)
- 2. Paul Scherrer Institut, General Energy Research Department, 5232 Villigen PSI (Switzerland)
Description
In this study is reported the deposition of hydroxypropyl methylcellulose (HPMC) and ethylcellulose (EC) by matrix-assisted pulsed laser evaporation (MAPLE). Both HPMC and EC were deposited on silicon substrates using a Nd:YAG laser (266 nm, 5 ns laser pulse and 10 Hz repetition rate) and then characterized by atomic force microscopy and Fourier transform infrared spectroscopy. It was found that for laser fluences up to 450 mJ/cm2 the structure of the deposited HPMC and EC polymer in the thin film resembles to the bulk. Morphological investigations reveal island features on the surface of the EC thin films, and pores onto the HPMC polymer films. The obtained results indicate that MAPLE may be an alternative technique for the fabrication of new systems with desired drug release profile.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.apsusc.2013.11.058Additional details
Identifiers
- DOI
- 10.1016/j.apsusc.2013.11.058;
- PII
- S0169-4332(13)02136-3;
Publishing Information
- Journal Title
- Applied Surface Science
- Journal Volume
- 302
- Journal Page Range
- p. 87-91
- ISSN
- 0169-4332
- CODEN
- ASUSEE
Conference
- Title
- E-MRS 2013 symposium V on laser material interactions for micro- and nano-applications
- Dates
- 27-31 May 2013
- Place
- Strasbourg (France)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 46023007
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ATOMIC FORCE MICROSCOPY; DEPOSITION; EVAPORATION; FOURIER TRANSFORM SPECTROMETERS; NEODYMIUM LASERS; POLYMERS; PULSES; SILICON; SUBSTRATES; SURFACES; THIN FILMS
- Descriptors DEC
- ELEMENTS; FILMS; LASERS; MEASURING INSTRUMENTS; MICROSCOPY; PHASE TRANSFORMATIONS; SEMIMETALS; SOLID STATE LASERS; SPECTROMETERS
Optional Information
- Copyright
- Copyright (c) 2013 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.