Destructive and non-destructive evaluation of cu/cu diffusion bonding with interlayer aluminum
- 1. Department of Metallurgical and Materials Engineering, National Institute of Technology, Tiruchirappalli 620 015, Tamil Nadu, India. (India)
- 2. Associate Professor, Department of Metallurgical and Materials Engineering, National Institute of Technology, Tiruchirappalli 620 015, Tamil Nadu, India. (India)
Description
The current study is established an inspection procedure for assessing quality of diffusion bonded joints using destructive and non-destructive method. Diffusion bonding of commercially pure copper with aluminium interlayer was carried out uniaxial load at 15MPa for different temperatures under holding time 60 min in vacuum atmosphere. The bond qualities were determined by destructive and non-destructive testing method (ultrasonic C- scan). The bond interface and bonded samples were analysed using optical and scanning electron microscopy (SEM). The element composition of the fractured and bonded area is determined using the Energy Dispersive Spectrometry (EDS). The bond quality obtained by both testing methods and its parameters are correlated. The optimized bonding parameter for best bonding characteristics for copper diffusion bonding with aluminum interlayer is reported. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/1757-899X/330/1/012045Additional details
Identifiers
Publishing Information
- Journal Title
- IOP Conference Series. Materials Science and Engineering (Online)
- Journal Volume
- 330
- Journal Issue
- 1
- Journal Page Range
- [6 p.]
- ISSN
- 1757-899X
Conference
- Title
- International Conference on Recent Advances in Materials, Mechanical and Civil Engineering
- Dates
- 1-2 Jun 2017
- Place
- Hyderabad (India)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 52082064
- Subject category
- S36: MATERIALS SCIENCE; S47: OTHER INSTRUMENTATION;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ALUMINIUM; BONDING; COPPER; DIFFUSION; NONDESTRUCTIVE TESTING; SCANNING ELECTRON MICROSCOPY; SPECTROSCOPY; ULTRASONIC WAVES
- Descriptors DEC
- ELECTRON MICROSCOPY; ELEMENTS; FABRICATION; JOINING; MATERIALS TESTING; METALS; MICROSCOPY; SOUND WAVES; TESTING; TRANSITION ELEMENTS