X-ray scattering techniques in non destructive testing

Non destructive evaluation by compton scattering allows three-dimensional (3D) imaging of materials. Beside 3D imaging, a method allowing thickness measurement was developed, especially suitable for multilayer compounds. The accuracy is ± 0.01 mm. Compton scattering techniques also allow point by point density measurements in the near-surface zone of any component. An accuracy of 1% was achieved on light composite materials, and also on dense components provided by powder metallurgy. Another way of investigation concerns coherent - Compton ratio imaging technique which allows to measure the effective atomic number. (author)