Published September 25, 1995
| Version v1
Journal article
Surface layering in liquid gallium: An X-ray reflectivity study
Creators
- 1. Division of Applied Sciences and Department of Physics, Harvard University, Cambridge, Massachusetts 02138 (United States)
- 2. Department of Physics, Bar-Ilan University, Ramat-Gan 52100 (Israel)
- 3. Department of Physics, Brookhaven National Laboratory, Upton, New York 11973 (United States)
- 4. National Synchrotron Light Source, Brookhaven National Laboratory, Upton, New York 11973 (United States)
Description
Surface-induced atomic layering in liquid gallium has been observed using x-ray reflectivity, ultrahigh vacuum conditions, and sputtered clean surfaces. Reflectivity data, collected on a supercooled liquid sample to momentum transfers as large as qz=3.0 A-1, exhibit a strong maximum near 2.4 A-1 indicating a layer spacing that is comparable to its atomic dimensions. The amplitude of the electron density oscillations decays with a characteristic length of 6 A. This is unexpectedly twice that of recent results for Hg, and the difference may be related to covalent bonding or supercooling
Additional details
Publishing Information
- Journal Title
- Physical Review Letters
- Journal Volume
- 75
- Journal Issue
- 13
- Journal Page Range
- p. 2498-2501.
- ISSN
- 0031-9007
- CODEN
- PRLTAO
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 27055656
- Subject category
- S36: MATERIALS SCIENCE; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- GALLIUM; LIQUIDS; MICROSTRUCTURE; REFLECTIVITY; SUBCOOLING; SURFACE PROPERTIES; X-RAY SPECTROSCOPY
- Descriptors DEC
- COOLING; CRYSTAL STRUCTURE; ELEMENTS; FLUIDS; METALS; OPTICAL PROPERTIES; PHYSICAL PROPERTIES; SPECTROSCOPY