Interfacial slippage effect on the surface instability of a thin elastic film under van der Waals force
Creators
- 1. FML, Department of Engineering Mechanics, Tsinghua University, Beijing 100084 (China)
- 2. Institute of Applied Mechanics, Jinan University, Guangzhou 510632 (China)
Description
This paper studies the surface instability of an elastic thin solid film lying on a rigid substrate and subjected to van der Waals-like surface interactions. The effect of film-substrate interfacial slippage is accounted for by using a simplified linear cohesive interface model. It is found that the interfacial slippage generally plays a destabilizing role in the surface instability of the thin film. For highly compressible films with Poisson's ratio smaller than 0.25, the surface wrinkling behaviour previously inconceivable in the case of a perfectly bonded interface is now feasible if film-substrate interface slipping is permitted. In addition, our linear perturbation analysis shows that the critical conditions for the onset of surface instability can be modulated by adjusting the slippery stiffness of the interface. The result might be helpful for developing novel techniques to create micro-/nanosized surface patterns.
Availability note (English)
Available from http://dx.doi.org/10.1088/0022-3727/42/5/055302Additional details
Identifiers
- DOI
- 10.1088/0022-3727/42/5/055302;
- PII
- S0022-3727(09)93451-9;
Publishing Information
- Journal Title
- Journal of Physics. D, Applied Physics
- Journal Volume
- 42
- Journal Issue
- 5
- Journal Page Range
- [8 p.]
- ISSN
- 0022-3727
- CODEN
- JPAPBE
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 41125538
- Subject category
- S77: NANOSCIENCE AND NANOTECHNOLOGY;
- Descriptors DEI
- INSTABILITY; NANOSTRUCTURES; PERTURBATION THEORY; SUBSTRATES; THIN FILMS; VAN DER WAALS FORCES
- Descriptors DEC
- FILMS