Methodological aspects of the GW calculation of the carbon vacancy in 3C-SiC
Creators
- 1. CEA, DEN, Service de Recherches de Métallurgie Physique, F-91191 Gif-sur-Yvette (France)
Description
We employ the GW approximation to calculate the properties of the carbon vacancy, a prominent defect in irradiated 3C-SiC. The GW method has been recently proposed for point defects in order to cure the band gap problem of the usual approximations. However, its application relies on stringent approximations, such as the calculation of the relaxation energies of the atomic structures from another simpler approximation, namely the local density approximation. We assess here the validity of this approach in the complex case of the carbon vacancy. Finally, the calculated properties of the carbon vacancy are greatly affected by the use of the GW approximation with respect to earlier studies. The carbon vacancy is a rather shallow donor with a negative U behavior.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.nimb.2011.12.052Additional details
Identifiers
- DOI
- 10.1016/j.nimb.2011.12.052;
- PII
- S0168-583X(11)01171-2;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
- Journal Volume
- 277
- Journal Page Range
- p. 77-79
- ISSN
- 0168-583X
- CODEN
- NIMBEU
Conference
- Title
- Basic research on ionic-covalent materials for nuclear applications
- Acronym
- E-MRS Symposium L
- Dates
- 9-12 May 2011
- Place
- Nice (France)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 44034246
- Subject category
- S74: ATOMIC AND MOLECULAR PHYSICS;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- APPROXIMATIONS; ATOMS; CARBON; DENSITY; ELECTRONIC STRUCTURE; MANY-BODY PROBLEM; POINT DEFECTS; RELAXATION; SILICON CARBIDES; VACANCIES
- Descriptors DEC
- CALCULATION METHODS; CARBIDES; CARBON COMPOUNDS; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; ELEMENTS; NONMETALS; PHYSICAL PROPERTIES; POINT DEFECTS; SILICON COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2011 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.