Published April 15, 2012 | Version v1
Journal article

Methodological aspects of the GW calculation of the carbon vacancy in 3C-SiC

  • 1. CEA, DEN, Service de Recherches de Métallurgie Physique, F-91191 Gif-sur-Yvette (France)

Description

We employ the GW approximation to calculate the properties of the carbon vacancy, a prominent defect in irradiated 3C-SiC. The GW method has been recently proposed for point defects in order to cure the band gap problem of the usual approximations. However, its application relies on stringent approximations, such as the calculation of the relaxation energies of the atomic structures from another simpler approximation, namely the local density approximation. We assess here the validity of this approach in the complex case of the carbon vacancy. Finally, the calculated properties of the carbon vacancy are greatly affected by the use of the GW approximation with respect to earlier studies. The carbon vacancy is a rather shallow donor with a negative U behavior.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.nimb.2011.12.052

Additional details

Identifiers

DOI
10.1016/j.nimb.2011.12.052;
PII
S0168-583X(11)01171-2;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
Journal Volume
277
Journal Page Range
p. 77-79
ISSN
0168-583X
CODEN
NIMBEU

Conference

Title
Basic research on ionic-covalent materials for nuclear applications
Acronym
E-MRS Symposium L
Dates
9-12 May 2011
Place
Nice (France)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
44034246
Subject category
S74: ATOMIC AND MOLECULAR PHYSICS;
Resource subtype / Literary indicator
Conference
Descriptors DEI
APPROXIMATIONS; ATOMS; CARBON; DENSITY; ELECTRONIC STRUCTURE; MANY-BODY PROBLEM; POINT DEFECTS; RELAXATION; SILICON CARBIDES; VACANCIES
Descriptors DEC
CALCULATION METHODS; CARBIDES; CARBON COMPOUNDS; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; ELEMENTS; NONMETALS; PHYSICAL PROPERTIES; POINT DEFECTS; SILICON COMPOUNDS

Optional Information

Copyright
Copyright (c) 2011 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.