Published November 1995 | Version v1
Journal article Metadata-only

Multilayer mirror used in the soft X ray spectrum measurement of laser-produced plasma

Creators

  • 1. Institute of Nuclear Physics and Chemistry of CAEP, Chengdu, SC (China)

Description

The studies on dispersion property of soft X ray W/Si multilayer mirror are reported. Soft X ray emission from laser-produced plasma is measured by the multilayer mirror matching XRD. The energy resolution and reflectivity of W/Si (d = 2.47 nm) multilayer mirror at the X ray wave length λ=1.89 nm are estimated through comparison with signal detected by filter-XRD

Additional details

Publishing Information

Journal Title
Nuclear Electronics and Detection Technology
Journal Volume
15
Journal Issue
6
Journal Page Range
p. 368, 369-372.
ISSN
0258-0934
CODEN
HDYUEC

INIS

Country of Publication
China
Country of Input or Organization
China
INIS RN
27030381
Subject category
S70: PLASMA PHYSICS AND FUSION TECHNOLOGY;
Descriptors DEI
COMPARATIVE EVALUATIONS; ENERGY RESOLUTION; LASER-PRODUCED PLASMA; LAYERS; MIRRORS; OPTICAL DISPERSION; PLASMA DIAGNOSTICS; REFLECTIVITY; SEMICONDUCTOR DIODES; SILICON; SOFT X RADIATION; TUNGSTEN; X-RAY SPECTRA
Descriptors DEC
ELECTROMAGNETIC RADIATION; ELEMENTS; EVALUATION; IONIZING RADIATIONS; METALS; OPTICAL PROPERTIES; PHYSICAL PROPERTIES; PLASMA; RADIATIONS; RESOLUTION; SEMICONDUCTOR DEVICES; SEMIMETALS; SPECTRA; SURFACE PROPERTIES; TRANSITION ELEMENTS; X RADIATION