Published June 15, 2009
| Version v1
Journal article
XPS analysis of sonochemically prepared SbSI ethanogel
Creators
- 1. Solid State Physics Section, Silesian University of Technology, ul. Krasinskiego 8, 40-019 Katowice (Poland)
- 2. Institute of Physics, University of Silesia, Bankowa 14, 40-007 Katowice (Poland)
- 3. Institute of Material Science, University of Silesia, ul. Bankowa 12, 40-007 Katowice (Poland)
Description
This paper, for the first time, presents the results of the X-ray photoelectron spectroscopy (XPS) of the valence band and core levels in sonochemically prepared SbSI ethanogel consisting of nanowires. The XPS spectra were measured with monochromatized Al Kα radiation in the energy range of 0-1400 eV at room temperature. It was found that the sonochemically prepared SbSI ethanogel is a p-type semiconductor. The XPS determined composition of this material suggests the existence of antimony subiodide at surfaces of SbSI nanowires. The chemical shifts in SbSI ethanogel for the Sb, I and S states are reported. Experimentally obtained binding energies are compared with the results reported for single crystals of SbSI.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.apsusc.2009.04.138Additional details
Identifiers
- DOI
- 10.1016/j.apsusc.2009.04.138;
- PII
- S0169-4332(09)00520-0;
Publishing Information
- Journal Title
- Applied Surface Science
- Journal Volume
- 255
- Journal Issue
- 17
- Journal Page Range
- p. 7689-7694
- ISSN
- 0169-4332
- CODEN
- ASUSEE
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 44017619
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ALPHA PARTICLES; ANTIMONY COMPOUNDS; BINDING ENERGY; CHEMICAL SHIFT; EV RANGE; IODINE COMPOUNDS; MONOCRYSTALS; NANOSTRUCTURES; P-TYPE CONDUCTORS; QUANTUM WIRES; S STATES; SEMICONDUCTOR MATERIALS; SPECTRA; SULFUR COMPOUNDS; SURFACES; TEMPERATURE RANGE 0273-0400 K; VALENCE; X-RAY PHOTOELECTRON SPECTROSCOPY
- Descriptors DEC
- CHARGED PARTICLES; CRYSTALS; ELECTRON SPECTROSCOPY; ENERGY; ENERGY LEVELS; ENERGY RANGE; HALOGEN COMPOUNDS; IONIZING RADIATIONS; MATERIALS; NANOSTRUCTURES; PHOTOELECTRON SPECTROSCOPY; RADIATIONS; SEMICONDUCTOR MATERIALS; SPECTROSCOPY; TEMPERATURE RANGE
Optional Information
- Copyright
- Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.