Field emission properties of single crystal chromium disilicide nanowires

The composition, crystal structure, and field emission properties of high-crystallinity chromium disilicide (CrSi2) nanowires synthesized by a vapor deposition method have been studied. High resolution transmission electron microscopy, energy dispersive spectroscopy, and selected area electron diffraction studies confirm the single-crystalline structure and composition of the CrSi2 nanowires. Field emission measurements show that an emission current density of 0.1 μA/cm2 was obtained at a turn-on electric field intensity of 2.80 V/μm. The maximum emission current measured was 1.86 mA/cm2 at 3.6 V/μm. The relation between the emission current density and the electric field obtained follows the Fowler–Nordheim equation, with an enhancement coefficient of 1140. The electrical conductivity of single nanowires was measured by using four-point-probe specialized microdevices at different temperatures, and the calculated values are close to those reported in previous studies for highly conductive single crystal bulk CrSi2. The thermal tolerance of the nanowires was studied up to a temperature of 1100 °C. The stability of the field emission current, the I-E values, their thermal tolerance, and high electrical conductivity make CrSi2 nanowires a promising material for field emission applications.