Published January 3, 2005 | Version v1
Journal article

Enhancement of hole injection using O2 plasma-treated Ag anode for top-emitting organic light-emitting diodes

  • 1. Department of Materials Science and Engineering, Pohang University of Science and Technology (POSTECH), Pohang, Kyungbuk 790-784 (Korea, Republic of)
  • 2. LG Electronics Inc., Kumi, Kyungbuk, 730-030 (Korea, Republic of)
  • 3. Department of Materials Science and Engineering, Pohang University of Science and Technology (POSTECH), Pohang, Kyungbuk 790-784, Korea (Korea, Republic of)

Description

We report the enhancement of hole injection using AgOx layer between Ag anode and 4,4'-bis[N-(1-naphtyl)-N-phenyl-amino]biphenyl in top-emitting organic light-emitting diode (OLED). The turn-on voltage of OLEDs decreased from 17 to 7 V as Ag changed to AgOx by the surface treatment using O2 plasma. Synchrotron radiation photoelectron spectroscopy results showed that the work function increased about 0.4 eV by the O2 plasma treatment. This led to the decrease of the energy barrier for hole injection, reducing the turn-on voltage of OLEDs

Additional details

Identifiers

Publishing Information

Journal Title
Applied Physics Letters
Journal Volume
86
Journal Issue
1
Journal Page Range
p. 012104-012104.3
ISSN
0003-6951
CODEN
APPLAB

Optional Information

Notes
(c) 2005 American Institute of Physics