Published March 10, 2009 | Version v1
Journal article Metadata-only

A Study of Irradiation Stability of Carbon Nanotubes

Creators

  • 1. Department of Nuclear Engineering, Texas A and M University, College Station, Texas 77843-3133 (United States)
  • 2. Department of Material Science and Engineering, Texas A and M University, College Station, Texas 77843-3133 (United States)
  • 3. Department of Physics and Astronomy, Rice University, Houston, Texas 77005 (United States)
  • 4. Department of Physics and Texas Center of Superconductivity, University of Houston, Houston, Texas 77204 (United States)

Description

We report preliminary results on studying the radiation stability of carbon nanotubes (CNs). Three different combinations of radiation and in situ characterization are used. Experiments include 30 keV electron bombardment with in situ characterization using a scanning electron microscope (SEM), 30 keV Ga ion bombardment with in situ SEM characterization, and 2 MeV proton irradiation with in situ electric resistance measurements. The study shows the degradation of CNs with dimensional shrinkage upon radiation, and the existence of a quasi steady state of defect creation and annealing.

Additional details

Identifiers

DOI
10.1063/1.3120059;

Publishing Information

Journal Title
AIP Conference Proceedings
Journal Volume
1099
Journal Issue
1
Journal Page Range
p. 393-396
ISSN
0094-243X
CODEN
APCPCS

Conference

Title
12. international conference on application of accelerators in research and industry
Acronym
CAARI 2008
Dates
10-15 Aug 2008
Place
Fort Worth, TX (United States)

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
41036926
Subject category
S77: NANOSCIENCE AND NANOTECHNOLOGY; S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ANNEALING; CARBON; CRYSTAL DEFECTS; ELECTRIC CONDUCTIVITY; ELECTRON BEAMS; GALLIUM IONS; ION BEAMS; IRRADIATION; KEV RANGE; MEV RANGE; NANOTUBES; PHYSICAL RADIATION EFFECTS; PROTON BEAMS; SCANNING ELECTRON MICROSCOPY
Descriptors DEC
BEAMS; CHARGED PARTICLES; CRYSTAL STRUCTURE; ELECTRICAL PROPERTIES; ELECTRON MICROSCOPY; ELEMENTS; ENERGY RANGE; HEAT TREATMENTS; IONS; LEPTON BEAMS; MICROSCOPY; NANOSTRUCTURES; NONMETALS; NUCLEON BEAMS; PARTICLE BEAMS; PHYSICAL PROPERTIES; RADIATION EFFECTS

Optional Information

Notes
(c) 2009 American Institute of Physics