Modifying the composition of hydrogen-terminated silicon nanoparticles synthesized in a nonthermal rf plasma
Creators
- 1. Department of Chemistry, Purdue University, West Lafayette, Indiana 47907 (United States)
- 2. Department of Mechanical Engineering, University of Minnesota, Minneapolis, Minnesota 55455 (United States)
Description
Hydrogen-terminated silicon nanoparticles were synthesized over a broad range of conditions in a continuous flow, nonthermal rf plasma. The effects of three operating parameters--rf power, reactor pressure, and hydrogen flow rate--were examined in terms of their effects on particle crystallinity, size, and surface composition. Silicon-hydrogen composition was characterized in situ by Fourier transform infrared spectrometry, and particle structural morphology was examined with a transmission electron microscope. Amorphous or crystalline particles could be synthesized by appropriately adjusting the operating parameters. Over the majority of settings examined, the minimum power required to produce discrete crystalline particles was ∼20-30 W. Depending on the parameter settings, particles also exhibited hydrogen coverage ranging from predominantly monohydride (SiH) functional groups to more complex compositions of higher hydrides. Particles with the highest proportion of surface SiH bonds were consistently synthesized in the smallest diameter (4 mm i.d.) tube reactor.
Additional details
Identifiers
- DOI
- 10.1116/1.3276451;
Publishing Information
- Journal Title
- Journal of Vacuum Science and Technology. A, International Journal Devoted to Vacuum, Surfaces, and Films
- Journal Volume
- 28
- Journal Issue
- 2
- Journal Page Range
- p. 161-169
- ISSN
- 1553-1813
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 44011136
- Subject category
- S77: NANOSCIENCE AND NANOTECHNOLOGY; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- CHEMICAL BONDS; FLOW RATE; FOURIER TRANSFORM SPECTROMETERS; HYDRIDES; HYDROGEN; INFRARED SPECTRA; MORPHOLOGY; NANOSTRUCTURES; PLASMA; RF SYSTEMS; SILICON; SURFACES; TRANSMISSION ELECTRON MICROSCOPY
- Descriptors DEC
- ELECTRON MICROSCOPY; ELEMENTS; HYDROGEN COMPOUNDS; MEASURING INSTRUMENTS; MICROSCOPY; NONMETALS; SEMIMETALS; SPECTRA; SPECTROMETERS
Optional Information
- Notes
- (c) 2010 American Vacuum Society