Electron radiation damage in silicate glasses

Electron radiation damage in silicate glasses has been studied in-situ using HVEM. The damage is evident from the formation of oxygen bubbles and as an amorphous phase decomposition. The bubble formation if consistent with a mechanism involving the fragmentation of oxide bonds and subsequent oxygen stabilization by a cation migration process. The bond fragmentation mechanism appears to be predominantly from ionization. Bubble regression in the presence of phase separation has been observed and is consistent with enhanced oxygen diffusivity through the high silica phase