A detector system for non-contact imaging of contamination patterns
Description
A detector system for non-contact imaging of patterns on radioactively contaminated surfaces has been developed and tested at AECL Chalk River Laboratories. The detector system incorporates a collimated gamma detector mounted on a computer-controlled pan-tilt head to sequentially scan a square grid and generate a colour-mapped image of the radioactivity distribution. The detector used is a cadmium telluride diode based X-ray and gamma spectrometer. Traditional contact auto-radiography techniques and the use of expensive gamma cameras are not favoured in this application because of high ambient gamma fields and potentially high surface contamination levels. In one application, the non-contact radiograph-like images capture dispersal patterns of particulate contamination that falls off the outside surfaces of a waste package onto the bottom plate of the transfer flask containing the waste package. The images are being used to assess the effectiveness of techniques to reduce the amount of contamination on waste packages. The images are also being used to assess the effectiveness of techniques to retain the contamination on the bottom plate. (author)
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Additional details
Publishing Information
- Imprint Pagination
- 12 p.
- Report number
- AECL-CW--60000-CONF-018
Conference
- Title
- 7. International Topical Meeting on Nuclear Plant Instrumentation, Control, and Human-Machine Interface Technologies
- Acronym
- NPIC & HMIT 2010
- Dates
- 7-11 Nov 2010
- Place
- Las Vegas, NV (United States)
INIS
- Country of Publication
- Canada
- Country of Input or Organization
- Canada
- INIS RN
- 49101607
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CDTE SEMICONDUCTOR DETECTORS; CHALK RIVER NUCLEAR LABS; DIAGNOSTIC TECHNIQUES; GAMMA DETECTION; RADIOACTIVITY; SURFACE CONTAMINATION
- Descriptors DEC
- ATOMIC ENERGY OF CANADA LTD; CANADIAN ORGANIZATIONS; CONTAMINATION; DETECTION; MEASURING INSTRUMENTS; NATIONAL ORGANIZATIONS; RADIATION DETECTION; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS
Optional Information
- Notes
- 2 refs., 7 figs. This record replaces 49041763