SAD phasing by OASIS at different resolutions down to 0.30 nm and below
Creators
- 1. Beijing National Laboratory for Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences, Beijing 100080 (China)
- 2. Institute of Biophysics, Chinese Academy of Sciences, Beijing 100101 (China)
- 3. National Laboratory of Protein Engineering and Plant Genetic Engineering, Peking University, Beijing 100871 (China)
- 4. Department of Biotechnology and Biomaterial Chemistry, Nagoya University, Nagoya 4648603 (Japan)
- 5. Department of Cell Biology, University of Alabama at Birmingham (United States)
Description
Single-wavelength anomalous diffraction (SAD) phasing is increasingly important in solving de novo protein structures. Direct methods have been proved very efficient in SAD phasing. This paper aims at probing the low-resolution limit of direct-method SAD phasing. Two known proteins TT0570 and Tom70p were used as test samples. Sulfur-SAD data of the protein TT0570 were collected with conventional Cu-Kα source at 0.18 nm resolution. Its truncated subsets respectively at 0.21, 0.30, 0.35 and 0.40 nm resolutions were used in the test. TT0570 Cu-Kα sulfur-SAD data have an expected Bijvoet ratio <|ΔF|> / ∼ 0.55%. In the 0.21 nm case, a single run of OASIS-DM-ARP/wARP led automatically to a model containing 1178 of the total 1206 residues all docked into the sequence. In 0.30 and 0.35 nm cases, SAD phasing by OASIS-DM led to traceable electron density maps. In the 0.40 nm case, SAD phasing by OASIS-DM resulted in a degraded electron density map, which may be difficult to trace but still contains useful secondary-structure information. Test on real 0.33 nm selenium-SAD data of the protein Tom70p showed that even automatic model building was not successful, the combination of manual tracing and direct-method fragment extension was capable of significantly improving the electron-density map. This provides the possibility of effectively improving the manually built model before structure refinement is performed. (rapid communication)
Availability note (English)
Available from http://dx.doi.org/10.1088/1674-1056/17/1/001Additional details
Identifiers
Publishing Information
- Journal Title
- Chinese Physics. B
- Journal Volume
- 17
- Journal Issue
- 1
- Journal Page Range
- p. 1-9
- ISSN
- 1674-1056
INIS
- Country of Publication
- China
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 44123563
- Subject category
- S60: APPLIED LIFE SCIENCES; S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Descriptors DEI
- ELECTRON DENSITY; PROBES; PROTEIN STRUCTURE; PROTEINS; RESIDUES; RESOLUTION; SELENIUM; STRUCTURAL CHEMICAL ANALYSIS; SULFUR; WAVELENGTHS; X-RAY DIFFRACTION
- Descriptors DEC
- COHERENT SCATTERING; DIFFRACTION; ELEMENTS; NONMETALS; ORGANIC COMPOUNDS; SCATTERING; SEMIMETALS