Solute partitioning and interfacial segregation in TiAl-based alloys

Atom probe microscopy has been used to investigate elemental partitioning and segregation behavior in a TiAl-based alloy with a variety of alloying additions including Cr, Nb, W and B. These results indicate that in a stress-relieved state (2h at 900 C) and a reheated state (2h at 900 C, 2,184h at 800 C and 2h at 1,210 C) chromium, and to a lesser extent tungsten, is partitioned to the α2 phase. However, in an annealed state (2h at 900 C and 720 h at 800 C), these elements are partitioned to the γ phase. Segregation of chromium and tungsten to lamellar interfaces is observed in the stress-relieved material, but significant segregation was not observed in material subjected to the other heat treatments. A W- and B-enriched precipitate was observed in the reheated material and provides a possible explanation for the low tungsten concentrations measured in the matrix phases