Published January 2009 | Version v1
Journal article

Applications of damage models to durability investigations for electronic connectors

  • 1. Department of Mechanical Engineering, National Yunlin University of Science and Technology, 123 University Road, Section 3, Douliou, Yunlin 64002, Taiwan (China)

Description

Contact forces between terminals of an electronic connector and the corresponding counterparts play an important role on signal transmission. The mated terminal with insufficient contact force might severely raise electrical resistance and induce intermittence or disconnection of current eventually. The contact force of the terminal could decay dramatically after several thousand mating/unmating cycles. Critical plane approaches are adopted to estimate the service life indicating the number of cycles as the contact force of the terminal degrades beneath the certain value in the present study. Damage parameters based on various criteria are evaluated for the terminal under the cyclic loading conditions. Relationships among the damage parameter, the contact force reduction ratio, and the number of cycles are then constructed by linking numerical results to experimental measurements. It is validated that the Smith-Watson-Topper criterion could be successfully applied to the service life assessment of the terminal

Availability note (English)

Available from http://dx.doi.org/10.1016/j.matdes.2008.04.047

Additional details

Identifiers

DOI
10.1016/j.matdes.2008.04.047;
PII
S0261-3069(08)00127-1;

Publishing Information

Journal Title
Materials and Design
Journal Volume
30
Journal Issue
1
Journal Page Range
p. 194-199
ISSN
0261-3069
CODEN
MADSD2

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
40016545
Subject category
S42: ENGINEERING; S36: MATERIALS SCIENCE;
Descriptors DEI
CONNECTORS; DAMAGE; ELECTRIC CONDUCTIVITY; SERVICE LIFE; SIGNALS; TRANSMISSION
Descriptors DEC
CONDUCTOR DEVICES; ELECTRICAL EQUIPMENT; ELECTRICAL PROPERTIES; EQUIPMENT; LIFETIME; PHYSICAL PROPERTIES

Optional Information

Copyright
Copyright (c) 2008 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.