Applications of damage models to durability investigations for electronic connectors
Creators
- 1. Department of Mechanical Engineering, National Yunlin University of Science and Technology, 123 University Road, Section 3, Douliou, Yunlin 64002, Taiwan (China)
Description
Contact forces between terminals of an electronic connector and the corresponding counterparts play an important role on signal transmission. The mated terminal with insufficient contact force might severely raise electrical resistance and induce intermittence or disconnection of current eventually. The contact force of the terminal could decay dramatically after several thousand mating/unmating cycles. Critical plane approaches are adopted to estimate the service life indicating the number of cycles as the contact force of the terminal degrades beneath the certain value in the present study. Damage parameters based on various criteria are evaluated for the terminal under the cyclic loading conditions. Relationships among the damage parameter, the contact force reduction ratio, and the number of cycles are then constructed by linking numerical results to experimental measurements. It is validated that the Smith-Watson-Topper criterion could be successfully applied to the service life assessment of the terminal
Availability note (English)
Available from http://dx.doi.org/10.1016/j.matdes.2008.04.047Additional details
Identifiers
- DOI
- 10.1016/j.matdes.2008.04.047;
- PII
- S0261-3069(08)00127-1;
Publishing Information
- Journal Title
- Materials and Design
- Journal Volume
- 30
- Journal Issue
- 1
- Journal Page Range
- p. 194-199
- ISSN
- 0261-3069
- CODEN
- MADSD2
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 40016545
- Subject category
- S42: ENGINEERING; S36: MATERIALS SCIENCE;
- Descriptors DEI
- CONNECTORS; DAMAGE; ELECTRIC CONDUCTIVITY; SERVICE LIFE; SIGNALS; TRANSMISSION
- Descriptors DEC
- CONDUCTOR DEVICES; ELECTRICAL EQUIPMENT; ELECTRICAL PROPERTIES; EQUIPMENT; LIFETIME; PHYSICAL PROPERTIES
Optional Information
- Copyright
- Copyright (c) 2008 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.