Published January 2011 | Version v1
Journal article

Bound electron g-factor measurement by double-resonance spectroscopy on a fine-structure transition

  • 1. GSI Helmholtzzentrum fur Schwerionenforschung, Darmstadt (Germany)
  • 2. Inst. fur Angewandte Physik, Darmstadt (Germany)
  • 3. St. Petersburg State Univ., Dept. of Physics, St. Petersburg (Russian Federation)
  • 4. Imperial Coll. London, Physics Dept., London (United Kingdom)

Description

Precise determination of bound-electron g-factors in highly charged ions provides stringent tests for state of the art theoretical calculations. The scope reaches from relativistic electron-correlation effects on the one hand to bound-state QED terms on the other. Besides, the investigation can contribute to the determination of the fine-structure constant α. In a first approach with boron-like ions of spinless nuclei (e.g., 40Ar13+ and 40Ca15+), we will excite the 22P1/2-22P3/2 fine-structure transition with laser radiation and probe microwave transitions between Zeeman sublevels. From this laser-microwave double-resonance technique the g-factor can be determined on a ppb level of accuracy. We have prepared a cryogenic trap assembly with a creation trap and a spectroscopy trap-a half-open compensated cylindrical Penning trap. Argon gas will be injected through a remotely controlled valve, working at cryogenic temperature and in the field of a superconducting magnet. Ions are produced by electron impact ionization and transferred to the spectroscopy trap. In the future, the trap will be connected to the HITRAP facility at GSI, and the method will be applied to hyperfine-structure transitions of hydrogen-like heavy ions to measure electronic and nuclear magnetic moments. We present important techniques employed in the experiment. (author)

Availability note (English)

Available from DOI: https://doi.org/10.1139/P10-071

Additional details

Identifiers

Publishing Information

Journal Title
Canadian Journal of Physics
Journal Volume
89
Journal Issue
1
Journal Page Range
p. 79-84
ISSN
0008-4204

Optional Information

Notes
21 refs., 4 figs.