Modulation of surface plasmon resonance by magnetization reversal in Au/Fe/Au trilayer and wedge structure for achieving higher refractive index sensitivity
Creators
- 1. Tokyo University of Agriculture and Technology, Department of Electrical and Electronic Engineering, Koganei, Tokyo (Japan)
Description
We report enhancement of the transverse magneto-optic Kerr effect (TMOKE) in Au/Fe/Au trilayers for improving the refractive index (RI) sensitivity in surface plasmon resonance sensors by magnetic modulation. The thicknesses of the upper Au layer, the Fe layer and the lower Au layer with required thickness resolution were theoretically optimized to maximize the TMOKE intensity with perfect momentum matching, and 3% TMOKE intensity was obtained in a trilayer. Furthermore, a wedge-shaped Au thin film was fabricated on a glass substrate, and the incident angle showing minimum reflectivity was modulated, corresponding to a difference in momentum matching. Resolution of the metal layer thickness (0.26 nm) was demonstrated in a single sensor chip for maximizing the TMOKE intensity. Enhanced RI resolution is expected in sensor chips formed of a Au/Fe/wedge Au trilayer, which will contribute to improvements in the limit of detection when measuring the analytes by analyzing the resulting signals. (author)
Availability note (English)
Available from DOI: https://doi.org/10.35848/1347-4065/abea4bAdditional details
Identifiers
Publishing Information
- Journal Title
- Japanese Journal of Applied Physics (Online)
- Journal Volume
- 60
- Journal Issue
- SB
- Journal Page Range
- p. SBBI06.1-SBBI06.7
- ISSN
- 1347-4065
INIS
- Country of Publication
- Japan
- Country of Input or Organization
- Japan
- INIS RN
- 53074156
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- DIELECTRIC MATERIALS; ELECTRON BEAMS; FERROMAGNETIC MATERIALS; KERR EFFECT; MAGNETIC FIELDS; MAGNETIZATION; ORGANIC COMPOUNDS; PLASMONS; POLARONS; REFRACTIVE INDEX; RESONANCE; TERNARY ALLOY SYSTEMS; THIN FILMS; WAVELENGTHS
- Descriptors DEC
- ALLOY SYSTEMS; BEAMS; DIELECTRIC PROPERTIES; ELECTRICAL PROPERTIES; FILMS; LEPTON BEAMS; MAGNETIC MATERIALS; MATERIALS; OPTICAL PROPERTIES; PARTICLE BEAMS; PHYSICAL PROPERTIES; QUASI PARTICLES
Optional Information
- Notes
- 52 refs., 12 figs.