Published March 1989
| Version v1
Journal article
X-ray structural investigation of Nd-dopet lanthanum oxosulfide monocrystals
Creators
- 1. Vsesoyuznyj Nauchno-Issledovatel'skij Inst. Khimicheskikh Reaktivov i Osobo Chistykh Veshchestv, Moscow (USSR)
- 2. Gosudarstvennyj Nauchno-Issledovatel'skij i Proektnyj Inst. Redkometallicheskoj Promyshlennosti, Moscow (USSR)
- 3. Moskovskij Inst. Tonkoj Khimicheskoj Tekhnologii, Moscow (USSR)
Description
The method of X-ray structural analysis is used to refine the nature of point defects observed in neodymiumdoped lanthanum oxosulfide samples obtained by stockbarger-Bridgman. The following types of point defects are found: vacancies in lanthanum, sulfur and oxygen sublattices, mutual settlement of oxygen and sulfur atoms in the anion positions, introduced atoms. These defects have a significant effect on coordinates of atoms, interatomic distances and lattice parameters
Additional details
Additional titles
- Original title (Russian)
- Рентгеноструктурное исследование монокристаллов оксосульфида лантана, октивированного неодимом
Publishing Information
- Journal Title
- Kristallografiya
- Journal Volume
- 34
- Journal Issue
- 2
- Series
- Kristallografiya.
- Journal Page Range
- 487-490
- ISSN
- 0023-4761
- CODEN
- KRISA
INIS
- Country of Publication
- Russian Federation
- Country of Input or Organization
- USSR
- INIS RN
- 21001648
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Descriptors DEI
- CHEMICAL COMPOSITION; CRYSTAL LATTICES; DOPED MATERIALS; INTERATOMIC DISTANCES; LANTHANUM COMPOUNDS; LATTICE PARAMETERS; MONOCRYSTALS; NEODYMIUM COMPOUNDS; OXYSULFIDES; POINT DEFECTS
- Descriptors DEC
- CRYSTAL DEFECTS; CRYSTAL STRUCTURE; CRYSTALS; DISTANCE; MATERIALS; OXYGEN COMPOUNDS; RARE EARTH COMPOUNDS; SULFUR COMPOUNDS