Published June 2014 | Version v1
Journal article

CCD image sensor induced error in PIV applications

  • 1. Department of Thermal and Fluids Engineering, Universidad Carlos III, Madrid (Spain)
  • 2. Departamento de Sistemas oceanográficos y navales, Universidad Politécnica de Madrid, Madrid (Spain)

Description

The readout procedure of charge-coupled device (CCD) cameras is known to generate some image degradation in different scientific imaging fields, especially in astrophysics. In the particular field of particle image velocimetry (PIV), widely extended in the scientific community, the readout procedure of the interline CCD sensor induces a bias in the registered position of particle images. This work proposes simple procedures to predict the magnitude of the associated measurement error. Generally, there are differences in the position bias for the different images of a certain particle at each PIV frame. This leads to a substantial bias error in the PIV velocity measurement (∼0.1 pixels). This is the order of magnitude that other typical PIV errors such as peak-locking may reach. Based on modern CCD technology and architecture, this work offers a description of the readout phenomenon and proposes a modeling for the CCD readout bias error magnitude. This bias, in turn, generates a velocity measurement bias error when there is an illumination difference between two successive PIV exposures. The model predictions match the experiments performed with two 12-bit-depth interline CCD cameras (MegaPlus ES 4.0/E incorporating the Kodak KAI-4000M CCD sensor with 4 megapixels). For different cameras, only two constant values are needed to fit the proposed calibration model and predict the error from the readout procedure. Tests by different researchers using different cameras would allow verification of the model, that can be used to optimize acquisition setups. Simple procedures to obtain these two calibration values are also described. (paper)

Availability note (English)

Available from http://dx.doi.org/10.1088/0957-0233/25/6/065207

Additional details

Publishing Information

Journal Title
Measurement Science and Technology
Journal Volume
25
Journal Issue
6
Journal Page Range
[13 p.]
ISSN
0957-0233
CODEN
MSTCEP

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
47067304
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Descriptors DEI
CALIBRATION; CAMERAS; CHARGE-COUPLED DEVICES; ERRORS; FORECASTING; ILLUMINANCE; IMAGES; PARTICLES; PEAKS; READOUT SYSTEMS; SENSORS; SIMULATION; VELOCITY
Descriptors DEC
SEMICONDUCTOR DEVICES