Published April 1, 2005 | Version v1
Journal article

Development of low-noise double-sided silicon strip detector for cosmic soft gamma-ray Compton Camera

  • 1. Department of Physical Sciences, Hiroshima University, 1-3-1 Kagamiyama, Higashi-Hiroshima, Hiroshima 739-8526 (Japan)
  • 2. Stanford Linear Accelerator Center, Menlo Park, CA (United States)
  • 3. Institute of Space and Astronautical Science (ISAS), Aerospace Exploration Agency (JAXA), Sagamihara, Kanagawa 229-8510 (Japan)

Description

Double-sided silicon strip detectors (DSSD) provide a very promising technology for constructing a Compton Camera, which is expected to provide a high-sensitivity soft gamma-ray observation in the 0.1-20MeV energy range. The merits of DSSD are the high-energy resolution, high scattering efficiency, low radio-activation in the orbit, moderate radiation hardness, smaller Doppler broadening, large size, and stable performance. A key feature for optimal performance is the low noise level of the DSSD and the attached frontend electronics. We minimized the noise by optimization of the electrode geometry of the DSSD. We have thus obtained an energy resolution of 1.3keV (FWHM) for 60 and 122keV at -10-bar C. It was found that the detection efficiency for gamma-rays was uniform over the DSSD and the signal charge split between neighboring strips was not significant. We also confirmed that the Compton imaging by two DSSDs achieved a good angular resolution close to the Doppler-broadening limit

Additional details

Identifiers

DOI
10.1016/j.nima.2005.01.074;
PII
S0168-9002(05)00161-0;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
Journal Volume
541
Journal Issue
1-2
Journal Page Range
p. 342-349
ISSN
0168-9002
CODEN
NIMAER

Conference

Title
5. international symposium on development and application of semiconductor tracking detectors
Acronym
STD 5
Dates
14-17 Jun 2004
Place
Hiroshima (Japan)

Optional Information

Copyright
Copyright (c) 2005 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.