Published January 2005
| Version v1
Journal article
Toward time-resolved soft X-ray microscopy using pulsed fs-high-harmonic radiation
Creators
- 1. RheinAhrCampus, University of Applied Sciences, Suedallee 2, 53424 Remagen (Germany)
- 2. University of Wuerzburg, Physics Department EP1, Am Hubland, 97074 Wuerzburg (Germany)
- 3. University of Bielefeld, Faculty of Physics, Universitaetstsstrasse 25, 33615 Bielefeld (Germany)
Description
Coherent soft X-ray sources open the way to new capabilities in high-resolution imaging, site- and element-specific spectroscopy and biomicroscopy. In this paper we demonstrate imaging with a table-top soft X-ray microscope. By combining a laser driven high-harmonic light source, optimized for having the maximum brightness at around 100 eV, a pair of multilayer mirrors to select a narrow spectral band and acting simultaneously as a condenser and a Fresnel zone plate as microscope objective, we were able to resolve 200 nm structures of a diatom sample. Further, the pulsed nature of our X-ray source offers the possibility of time-resolved spectromicroscopy with a temporal resolution in the order of a few femtoseconds
Additional details
Identifiers
- DOI
- 10.1016/j.ultramic.2004.09.001;
- PII
- S0304-3991(04)00171-8;
Publishing Information
- Journal Title
- Ultramicroscopy (Amsterdam)
- Journal Volume
- 102
- Journal Issue
- 2
- Journal Page Range
- p. 93-100
- ISSN
- 0304-3991
- CODEN
- ULTRD6
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 37036556
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- BRIGHTNESS; DIATOMS; EV RANGE 10-100; HARMONIC GENERATION; LIGHT SOURCES; MICROSCOPES; MICROSCOPY; OPTICS; SOFT X RADIATION; SPECTROSCOPY; TIME RESOLUTION; X-RAY SOURCES
- Descriptors DEC
- ALGAE; CHROMOPHYCOTA; ELECTROMAGNETIC RADIATION; ENERGY RANGE; EV RANGE; FREQUENCY MIXING; IONIZING RADIATIONS; OPTICAL PROPERTIES; PHYSICAL PROPERTIES; PLANTS; RADIATION SOURCES; RADIATIONS; RESOLUTION; TIMING PROPERTIES; X RADIATION
Optional Information
- Copyright
- Copyright (c) 2004 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.