Determination of positron beam parameters by various diagnostic techniques
Creators
- 1. Physik Department E 21, James-Franck-Strasse, Technische Universitaet Muenchen, D-85748 Garching (Germany)
- 2. ZWE FRM II Lichtenbergstrasse 1, Technische Universitaet Muenchen, D-85747 Garching (Germany)
Description
Various diagnostic techniques have been applied at the neutron-induced positron source Munich NEPOMUC in order to determine the positron beam parameters such as intensity, beam shape and energy distribution. The positron beam intensity is determined by the detection of the annihilation radiation of positrons, which annihilate in a movable target. The use of a micro-channel plate (MCP) detector with a CCD-camera allows a direct measurement of the positron beam shape and the lateral resolved intensity distribution. At NEPOMUC a movable MCP-assembly inside the evacuated beam line enables a quick examination of the beam shape during operation. A retarding grid was mounted inside the homogeneous magnetic guiding field in order to determine the distribution of the longitudinal positron momentum, and hence estimate the energy distribution of the positrons
Availability note (English)
Available from http://dx.doi.org/10.1016/j.apsusc.2008.05.306Additional details
Identifiers
- DOI
- 10.1016/j.apsusc.2008.05.306;
- PII
- S0169-4332(08)01203-8;
Publishing Information
- Journal Title
- Applied Surface Science
- Journal Volume
- 255
- Journal Issue
- 1
- Journal Page Range
- p. 50-53
- ISSN
- 0169-4332
- CODEN
- ASUSEE
Conference
- Title
- 11. international workshop on slow positron beam techniques for solids and surfaces
- Acronym
- LOPOS-11
- Dates
- 9-13 Jul 2007
- Place
- Orleans (France)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 40082930
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ANNIHILATION; CAMERAS; CHARGE-COUPLED DEVICES; DETECTION; DIAGNOSTIC TECHNIQUES; ENERGY SPECTRA; NEUTRONS; POSITRON BEAMS; POSITRON SOURCES; POSITRONS; SHAPE
- Descriptors DEC
- ANTILEPTONS; ANTIMATTER; ANTIPARTICLES; BARYONS; BEAMS; ELEMENTARY PARTICLES; FERMIONS; HADRONS; INTERACTIONS; LEPTON BEAMS; LEPTONS; MATTER; NUCLEONS; PARTICLE BEAMS; PARTICLE INTERACTIONS; PARTICLE SOURCES; RADIATION SOURCES; SEMICONDUCTOR DEVICES; SPECTRA
Optional Information
- Copyright
- Copyright (c) 2008 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.