Published July 2005 | Version v1
Miscellaneous

Static beam position monitor for a small ion storage ring S-LSR

  • 1. Kyoto Univ., Institute for Chemical Research, Uji, Kyoto (Japan)
  • 2. Accelerator Engineering, Co., Ltd., Chiba, Chiba (Japan)
  • 3. National Institute of Radiological Sciences, Chiba, Chiba (Japan)

Description

The static beam position monitors for a small ion storage ring S-LSR are being developed now. The monitors are installed at the chamber for a bending magnet because of the limited available space. The monitor is composed of four electrodes whose shape is a right triangle and dimension is 100[mm] x 200[mm]. The shape of the monitor aperture is octagon, and the distance between upper electrodes and lower electrodes is 46 ± 0.3[mm]. The position information of the monitors is calibrated with a test chamber. Two methods for position identification are proposed. One is Difference over Sum method, another is Log Ratio method. The linearity about ± 50[mm] was realized by the latter signal identification method. This region is the full length of the monitor electrode. (author)

Part of:
The 2nd annual meeting of Particle Accelerator Society of Japan and the 30th Linear Accelerator Meeting in Japan

Additional details

Publishing Information

Imprint Title
The 2nd annual meeting of Particle Accelerator Society of Japan and the 30th Linear Accelerator Meeting in Japan
Imprint Pagination
819 p.
Journal Page Range
p. 60-62

Conference

Title
2. annual meeting of Particle Accelerator Society of Japan and 30. Linear Accelerator Meeting in Japan
Dates
20-22 Jul 2005
Place
Tosu, Saga (Japan)

INIS

Country of Publication
Japan
Country of Input or Organization
Japan
INIS RN
40085384
Subject category
S43: PARTICLE ACCELERATORS;
Resource subtype / Literary indicator
Conference, Non-conventional Literature
Descriptors DEI
APERTURES; BEAM BENDING MAGNETS; BEAM MONITORING; BEAM POSITION; EDUCATIONAL FACILITIES; ELECTRODES; HEAVY IONS; JAPANESE ORGANIZATIONS; MONITORS; PROTONS; SHAPE; SIGNALS; STORAGE RINGS
Descriptors DEC
BARYONS; CHARGED PARTICLES; ELEMENTARY PARTICLES; EQUIPMENT; FERMIONS; HADRONS; IONS; MAGNETS; MEASURING INSTRUMENTS; MONITORING; NATIONAL ORGANIZATIONS; NUCLEONS; OPENINGS

Optional Information

Notes
2 refs., 6 figs.