Published 1993
| Version v1
Journal article
Micro PIXE analysis using an X-ray from incident ions
- 1. Osaka National Research Inst., AIST, Ikeda (Japan)
Description
A possibility of using an X-ray from incident ions in micro PIXE measurement with MeV heavy ions was discussed. To reveal the feature, a Cu-Ti plate was analyzed by a 5 MeV silicon and a 5 MeV nickel ion microprobe and the PIXE-mapping images of the X-rays from the incident ions were compared with the normal PIXE-mapping images of the X-rays from the target. These images indirectly reflected the distribution of a specific element with good statistics. (author)
Additional details
Publishing Information
- Journal Title
- International Journal of PIXE
- Journal Volume
- 3
- Journal Issue
- 4
- Journal Page Range
- p. 307-312.
- ISSN
- 0129-0835
- CODEN
- IJPXET
INIS
- Country of Publication
- Japan
- Country of Input or Organization
- Japan
- INIS RN
- 26049331
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Descriptors DEI
- COMPARATIVE EVALUATIONS; COPPER; HEAVY IONS; IMAGES; ION MICROPROBE ANALYSIS; MAPPING; PIXE ANALYSIS; PLATES; TITANIUM; X RADIATION
- Descriptors DEC
- CHARGED PARTICLES; CHEMICAL ANALYSIS; ELECTROMAGNETIC RADIATION; ELEMENTS; EVALUATION; IONIZING RADIATIONS; IONS; METALS; MICROANALYSIS; NONDESTRUCTIVE ANALYSIS; RADIATIONS; TRANSITION ELEMENTS; X-RAY EMISSION ANALYSIS