Highly transparent, flexible and hydrophilic ZnS thin films prepared by a facile and environmentally friendly chemical bath deposition method
Creators
- 1. Department of Chemistry, Surface Chemistry Research Laboratory, Iran University of Science and Technology, Tehran 16846-13114 (Iran, Islamic Republic of)
- 2. Advanced Materials Research Center, Materials and Energy Research Center, Karaj (Iran, Islamic Republic of)
Description
Highlights: • Growth of high quality ZnS thin films by chemical bath deposition method is proposed. • Flexible ZnS thin films were fabricated using non-toxic materials. • XRD, XPS and Raman analyses prove the formation of absolute ZnS. • Prepared ZnS thin films have a hydrophilic nature. - Abstract: Growth of highly transparent and hydrophilic ZnS thin films on flexible polymeric and glass substrates has been performed using an environmentally friendly chemical bath deposition method with an ammonia and thioacetamide free reaction solution. Deposition time effect on surface morphology, structure and optical properties of the ZnS thin films has been investigated by field emission scanning electron microscopy (FE-SEM), atomic force microscopy (AFM), transmission electron microscopy (TEM), X-ray diffractometer (XRD), ultraviolet-visible light (UV–vis) spectroscopy, and photoluminescence (PL) spectroscopy. Also, the chemical composition of the prepared films has been studied in detail by energy-dispersive X-ray spectrometer (EDX), X-ray photoelectron spectroscopy (XPS) and Raman spectroscopy. TEM images show that the ZnS films consisted of small nanocrystals with diameters ≤5 nm. Moreover, the water contact angles, 38.5° and 25.4° for ZnS films deposited on PS and on glass substrates, respectively, indicate a highly hydrophilic nature. Undoubtedly, the chemical analysis shows the formation of the films with a chemical composition of ZnS0.89, lacking impurities such as ZnO and/or Zn (OH)2. Additionally, FE-SEM images show a homogenous deposition over a very large surface area substrates. Ultimately, the obtained photoluminescence spectrum indicates a strong and broad emission peak ranging from 400 to 600 nm, which are due to deep levels or trap state defects in the crystalline structure of the ZnS films.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.tsf.2018.02.021Additional details
Identifiers
- DOI
- 10.1016/j.tsf.2018.02.021;
- PII
- S0040609018301081;
Publishing Information
- Journal Title
- Thin Solid Films
- Journal Volume
- 651
- Journal Page Range
- p. 97-110
- ISSN
- 0040-6090
- CODEN
- THSFAP
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 50035411
- Subject category
- S77: NANOSCIENCE AND NANOTECHNOLOGY;
- Descriptors DEI
- ATOMIC FORCE MICROSCOPY; DEPOSITION; FIELD EMISSION; GLASS; IMPURITIES; NANOSTRUCTURES; OPTICAL PROPERTIES; PHOTOLUMINESCENCE; RAMAN SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY; SUBSTRATES; SURFACE AREA; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; X-RAY DIFFRACTION; X-RAY DIFFRACTOMETERS; X-RAY PHOTOELECTRON SPECTROSCOPY; X-RAY SPECTROMETERS; ZINC OXIDES; ZINC SULFIDES
- Descriptors DEC
- CHALCOGENIDES; COHERENT SCATTERING; DIFFRACTION; DIFFRACTOMETERS; ELECTRON MICROSCOPY; ELECTRON SPECTROSCOPY; EMISSION; FILMS; INORGANIC PHOSPHORS; LASER SPECTROSCOPY; LUMINESCENCE; MEASURING INSTRUMENTS; MICROSCOPY; OXIDES; OXYGEN COMPOUNDS; PHOSPHORS; PHOTOELECTRON SPECTROSCOPY; PHOTON EMISSION; PHYSICAL PROPERTIES; SCATTERING; SPECTROMETERS; SPECTROSCOPY; SULFIDES; SULFUR COMPOUNDS; SURFACE PROPERTIES; ZINC COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2017 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.