Published June 1972 | Version v1
Journal article

Scatter spectroscopy

Description

In high flux density ionizing photon fields, it is usually difficult to measure photon spectra with Ge(Li) or Si(Li) semiconductor radiation detectors. A method which is an extension of that reported by Unsworth and Greening has been developed to sample scattered photons from a photon beam. A thin sheet of low atomic number material is placed in the photon beam and is observed by a collimated detector from some convenient angle, θ, away from the beam direction. Only a small fraction of the photons are scattered into the solid angle of the detector. An approximation of the energy spectrum of the primary beam may be obtained by calculating the primary photon energies from the measured scattered photon energy spectrum. This method differs from that of Unsworth and Greening by considering Compton and Rayleigh scattering separately.

Additional details

Identifiers

Publishing Information

Journal Title
IEEE Transactions on Nuclear Science
Journal Volume
19
Journal Issue
3
Series
IEEE (Inst. Elec. Electron. Eng.), Trans. Nucl. Sci.
Journal Page Range
411-417
ISSN
0018-9499

Conference

Title
13. scintillation and semiconductor counter symposium.
Dates
1 Mar 1972.
Place
Washington, DC.

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
4061517
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
LI-DRIFTED GE DETECTORS; LI-DRIFTED SI DETECTORS; MEASURING METHODS; PHOTON BEAMS; SCATTERING; SPECTRA; SPECTROSCOPY
Descriptors DEC
BEAMS; GE SEMICONDUCTOR DETECTORS; MEASURING INSTRUMENTS; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS; SI SEMICONDUCTOR DETECTORS

Optional Information

Notes
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