Scatter spectroscopy
Description
In high flux density ionizing photon fields, it is usually difficult to measure photon spectra with Ge(Li) or Si(Li) semiconductor radiation detectors. A method which is an extension of that reported by Unsworth and Greening has been developed to sample scattered photons from a photon beam. A thin sheet of low atomic number material is placed in the photon beam and is observed by a collimated detector from some convenient angle, θ, away from the beam direction. Only a small fraction of the photons are scattered into the solid angle of the detector. An approximation of the energy spectrum of the primary beam may be obtained by calculating the primary photon energies from the measured scattered photon energy spectrum. This method differs from that of Unsworth and Greening by considering Compton and Rayleigh scattering separately.
Additional details
Identifiers
Publishing Information
- Journal Title
- IEEE Transactions on Nuclear Science
- Journal Volume
- 19
- Journal Issue
- 3
- Series
- IEEE (Inst. Elec. Electron. Eng.), Trans. Nucl. Sci.
- Journal Page Range
- 411-417
- ISSN
- 0018-9499
Conference
- Title
- 13. scintillation and semiconductor counter symposium.
- Dates
- 1 Mar 1972.
- Place
- Washington, DC.
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 4061517
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- LI-DRIFTED GE DETECTORS; LI-DRIFTED SI DETECTORS; MEASURING METHODS; PHOTON BEAMS; SCATTERING; SPECTRA; SPECTROSCOPY
- Descriptors DEC
- BEAMS; GE SEMICONDUCTOR DETECTORS; MEASURING INSTRUMENTS; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS; SI SEMICONDUCTOR DETECTORS
Optional Information
- Notes
- Updated automatically by Metadata and Full-Text Enrichment Agent