Published November 2004
| Version v1
Journal article
Crystallographic and magnetic properties of Ho3Fe29-xTx (T=V and Cr)
Description
A systematic study of syntheses, crystallographic and magnetic properties of the Ho3Fe27.0V2.0 and Ho3Fe29-xCrx (x=3.0 and 3.5) compounds has been performed in this work. The lattice parameters, Curie temperature TC, the saturation magnetization MS and the anisotropy field HA--at 4.2 K and room temperature--for the Ho3Fe29-xTx (T=V and Cr) compounds were obtained. Spin reorientations of easy magnetization direction (EMD) are observed at around 150 K for Ho3Fe27.0V2.0 and Ho3Fe29-xCrx (x=3.0 and 3.5). First order magnetization process (FOMP) occurs in magnetization curves at 1.5 K for the magnetically aligned samples of Ho3Fe27.0V2.0 and Ho3Fe25.5Cr3.5
Additional details
Identifiers
- DOI
- 10.1016/j.jmmm.2004.04.047;
- PII
- S0304885304004640;
Publishing Information
- Journal Title
- Journal of Magnetism and Magnetic Materials
- Journal Volume
- 282
- Journal Issue
- 5-6
- Journal Page Range
- p. 206-210
- ISSN
- 0304-8853
- CODEN
- JMMMDC
Conference
- Title
- International symposium on advanced magnetic technologies
- Dates
- 13-16 Nov 2003
- Place
- Taipei, Taiwan (China)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 36061740
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ANISOTROPY; CHROMIUM COMPOUNDS; CRYSTALLOGRAPHY; CURIE POINT; HOLMIUM COMPOUNDS; IRON COMPOUNDS; LATTICE PARAMETERS; MAGNETIC PROPERTIES; MAGNETIZATION; MAGNETS; SYNTHESIS; TEMPERATURE RANGE 0000-0013 K; TEMPERATURE RANGE 0065-0273 K; TEMPERATURE RANGE 0273-0400 K; VANADIUM COMPOUNDS
- Descriptors DEC
- EQUIPMENT; PHYSICAL PROPERTIES; RARE EARTH COMPOUNDS; TEMPERATURE RANGE; THERMODYNAMIC PROPERTIES; TRANSITION ELEMENT COMPOUNDS; TRANSITION TEMPERATURE
Optional Information
- Copyright
- Copyright (c) 2004 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.