Published August 1, 2004 | Version v1
Journal article

Nano-displacement measurements using spatially multimode squeezed light

  • 1. Australian Centre for Quantum-Atom Optics, Department of Physics, Australian National University, Canberra ACT 0200 (Australia)
  • 2. Laboratoire Kastler Brossel, Universite Pierre et Marie Curie, case 74, 75252 Paris cedex 05 (France)

Description

We demonstrate the possibility of surpassing the quantum noise limit for simultaneous multi-axis spatial displacement measurements that have zero mean values. The requisite resources for these measurements are squeezed light beams with exotic transverse mode profiles. We show that, in principle, lossless combination of these modes can be achieved using the non-degenerate Gouy phase shift of optical resonators. When the combined squeezed beams are measured with quadrant detectors, we experimentally demonstrate a simultaneous reduction in the transverse x- and y-displacement fluctuations of 2.2 and 3.1 dB below the quantum noise limit

Availability note (English)

Available online at http://stacks.iop.org/1464-4266/6/S664/job4_8_007.pdf or at the Web site for the Journal of Optics. B, Quantum and Semiclassical Optics (Print) (ISSN 1464-4266) http://www.iop.org/

Additional details

Publishing Information

Journal Title
Journal of Optics. B, Quantum and Semiclassical Optics (Print)
Journal Volume
6
Journal Issue
8
Journal Page Range
p. S664-S674
ISSN
1464-4266

Conference

Title
SPIE international symposium on fluctuations and noise
Dates
1-4 Jun 2003
Place
Santa Fe, NM (United States)

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
36029675
Subject category
S74: ATOMIC AND MOLECULAR PHYSICS; S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
Resource subtype / Literary indicator
Conference
Descriptors DEI
FLUCTUATIONS; MEASURING METHODS; NOISE; PHASE SHIFT; PHOTON BEAMS; QUANTUM MECHANICS; RESONATORS; VISIBLE RADIATION
Descriptors DEC
BEAMS; ELECTROMAGNETIC RADIATION; ELECTRONIC EQUIPMENT; EQUIPMENT; MECHANICS; RADIATIONS; VARIATIONS