Published July 2002
| Version v1
Journal article
Twinmic: a European twin microscope station combining full-field imaging and scanning microscopy
Creators
- 1. Elettra, Sincrotrone Trieste (Italy)
- 2. European Synchrotron Radiation Facility ESRF, 38 - Grenoble (France)
- 3. Paul Scherrer Inst. (PSI), Villigen (Switzerland)
- 4. TASC/INFM, Trieste (Italy)
- 5. King's College London, Dept. of Physics, London (United Kingdom)
- 6. Gottingen Universitat, Institute for X-Ray Physics (Germany)
- 7. RheinAhrCampus Remagen (Germany)
- 8. ITPO, Ljubljana (Slovakia)
Description
The two types of X-ray microscopes, scanning and full-field imaging, have different but complementary capabilities in term of image acquisition and spectroscopies. The novel approach used for the first time in the EU RT and D project 'Twinmic' (HPRI-CT-2001-50024) aims at building of a multipurpose end-station combining scanning and full-field imaging microscopes with easy switch between the two modes. The twin microscope iS expected to achieve the state-of-art performance of both microscopy modes in fast imaging, tomography and spectroscopy (μ-XANES/XRF), allowing new class of experiments in exploration of heterogeneous phenomena of the matter at mesoscopic length scales. (authors)
Additional details
Publishing Information
- Journal Title
- Journal de Physique. 4
- Journal Volume
- 104
- Journal Page Range
- p. 103-107
- ISSN
- 1155-4339
- CODEN
- JPICEI
Conference
- Title
- 7. international conference on X-Ray microscopy - X-Ray microscopy 2002
- Dates
- 28 Jul - 2 Aug 2002
- Place
- Grenoble (France)
INIS
- Country of Publication
- France
- Country of Input or Organization
- France
- INIS RN
- 34066038
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- BEAM OPTICS; OPTICAL MICROSCOPES; SPECIFICATIONS; SYNCHROTRON RADIATION; X RADIATION
- Descriptors DEC
- BREMSSTRAHLUNG; ELECTROMAGNETIC RADIATION; IONIZING RADIATIONS; MICROSCOPES; RADIATIONS
Optional Information
- Notes
- 10 refs.