Optical properties of nitrogen-doped graphene thin films probed by spectroscopic ellipsometry
Creators
- 1. Department of Physics, National Taiwan Normal University, Taipei 11677, Taiwan (China)
- 2. Institute of Atomic and Molecular Sciences, Academia Sinica, Taipei 10617, Taiwan (China)
Description
Nitrogen-doped graphene thin films were prepared by either chemical vapor deposition (CVD) or electrochemical exfoliation (ECE). Their optical properties were determined in the spectral region of 0.73–6.42 eV and at temperatures between 200 and 350 K by spectroscopic ellipsometry. The parameters of the dispersive structures were derived by numerical fitting of the experimental data to the stacked layer model. The optical absorption spectrum of the CVD-grown thin films is characterized by an asymmetric Fano resonance in the ultraviolet frequency region. In contrast, the line shape of the ECE-grown thin films displays less asymmetric. The excitonic resonance of the nitrogen-doped thin films is overall blue shifted by ∼ 0.2–0.3 eV compared with that of undoped analog. We interpret these results in terms of the exothermic nature of triazine molecule adsorption due to binding to graphene's surface via electron rich nitrogen. - Highlights: • Optical properties of N-doped graphene films determined by spectroscopic ellipsometry • Fano resonance in the ultraviolet frequency region of all graphene film absorption spectra • Blueshift in the excitonic resonance of N-doped graphene thin films is observed
Availability note (English)
Available from http://dx.doi.org/10.1016/j.tsf.2014.05.020Additional details
Identifiers
- DOI
- 10.1016/j.tsf.2014.05.020;
- PII
- S0040-6090(14)00555-0;
Publishing Information
- Journal Title
- Thin Solid Films
- Journal Volume
- 571
- Journal Issue
- Part 3
- Journal Page Range
- p. 675-679
- ISSN
- 0040-6090
- CODEN
- THSFAP
Conference
- Title
- 6. international conference on spectroscopic ellipsometry
- Acronym
- ICSE-VI
- Dates
- 26-31 May 2013
- Place
- Kyoto (Japan)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 47004378
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ABSORPTION SPECTRA; ADSORPTION; CHEMICAL VAPOR DEPOSITION; COMPARATIVE EVALUATIONS; DOPED MATERIALS; ELECTROCHEMISTRY; ELECTRONS; ELLIPSOMETRY; GRAPHENE; LAYERS; NITROGEN; OPTICAL PROPERTIES; RESONANCE; SURFACES; TEMPERATURE DEPENDENCE; THIN FILMS; ULTRAVIOLET RADIATION
- Descriptors DEC
- CARBON; CHEMICAL COATING; CHEMISTRY; DEPOSITION; ELECTROMAGNETIC RADIATION; ELEMENTARY PARTICLES; ELEMENTS; EVALUATION; FERMIONS; FILMS; LEPTONS; MATERIALS; MEASURING METHODS; NONMETALS; PHYSICAL PROPERTIES; RADIATIONS; SORPTION; SPECTRA; SURFACE COATING
Optional Information
- Copyright
- Copyright (c) 2014 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.