Published November 28, 2014 | Version v1
Journal article

Optical properties of nitrogen-doped graphene thin films probed by spectroscopic ellipsometry

  • 1. Department of Physics, National Taiwan Normal University, Taipei 11677, Taiwan (China)
  • 2. Institute of Atomic and Molecular Sciences, Academia Sinica, Taipei 10617, Taiwan (China)

Description

Nitrogen-doped graphene thin films were prepared by either chemical vapor deposition (CVD) or electrochemical exfoliation (ECE). Their optical properties were determined in the spectral region of 0.73–6.42 eV and at temperatures between 200 and 350 K by spectroscopic ellipsometry. The parameters of the dispersive structures were derived by numerical fitting of the experimental data to the stacked layer model. The optical absorption spectrum of the CVD-grown thin films is characterized by an asymmetric Fano resonance in the ultraviolet frequency region. In contrast, the line shape of the ECE-grown thin films displays less asymmetric. The excitonic resonance of the nitrogen-doped thin films is overall blue shifted by ∼ 0.2–0.3 eV compared with that of undoped analog. We interpret these results in terms of the exothermic nature of triazine molecule adsorption due to binding to graphene's surface via electron rich nitrogen. - Highlights: • Optical properties of N-doped graphene films determined by spectroscopic ellipsometry • Fano resonance in the ultraviolet frequency region of all graphene film absorption spectra • Blueshift in the excitonic resonance of N-doped graphene thin films is observed

Availability note (English)

Available from http://dx.doi.org/10.1016/j.tsf.2014.05.020

Additional details

Identifiers

DOI
10.1016/j.tsf.2014.05.020;
PII
S0040-6090(14)00555-0;

Publishing Information

Journal Title
Thin Solid Films
Journal Volume
571
Journal Issue
Part 3
Journal Page Range
p. 675-679
ISSN
0040-6090
CODEN
THSFAP

Conference

Title
6. international conference on spectroscopic ellipsometry
Acronym
ICSE-VI
Dates
26-31 May 2013
Place
Kyoto (Japan)

Optional Information

Copyright
Copyright (c) 2014 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.