Introduction to the Surface Spectra of Oxides
Creators
- 1. William R. Wiley Environmental Molecular Sciences Laboratory, Pacific Northwest National Laboratory, Richland, Washington (United States)
- 2. Department of Applied Physics, Yale University, New Haven, Connecticut (United States)
Description
Due to their technological importance and an increasing scientific interest, a set of data from oxide surfaces has been collected for publication in two special issues of Surface Science Spectra. This Introduction to these two special issues summarizes the data to be presented and provides short overviews of trends in both the physics and chemistry of metal-oxide surfaces and of some important aspects of the techniques used to examine these surfaces. The surface spectroscopies discussed in relation to oxides include: valence band photoemission (ultraviolet photoelectron spectroscopy and synchrotron based), core level photoemission (x-ray photoelectron spectroscopy, XPS), Auger electron spectroscopy (AES), (reflection) electron energy loss spectroscopy (R)EELS, high-resolution electron energy loss spectroscopy (HREELS), scanning probe methods, and ion scattering spectroscopy (ISS). Brief sections also discuss the nature of stoichiometric oxide surfaces, the physics and chemistry of defects on these surfaces, and adsorption on metal-oxide surfaces.copyright 1998 American Vacuum Society
Additional details
Publishing Information
- Journal Title
- Surface Science Spectra
- Journal Volume
- 4
- Journal Issue
- 3
- Journal Page Range
- p. 181-193
- ISSN
- 1055-5269
- CODEN
- SSSPEN
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 29037870
- Subject category
- S36: MATERIALS SCIENCE; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ADSORPTION; AUGER EFFECT; AUGER ELECTRON SPECTROSCOPY; CRYSTAL DEFECTS; ELECTRONIC STRUCTURE; ENERGY-LOSS SPECTROSCOPY; ION SCATTERING ANALYSIS; OXIDES; PHOTOELECTRON SPECTROSCOPY; PHOTOEMISSION; STOICHIOMETRY; SURFACE PROPERTIES; SURFACES
- Descriptors DEC
- CHALCOGENIDES; CHEMICAL ANALYSIS; CRYSTAL STRUCTURE; ELECTRON SPECTROSCOPY; EMISSION; NONDESTRUCTIVE ANALYSIS; OXYGEN COMPOUNDS; SECONDARY EMISSION; SORPTION; SPECTROSCOPY