Structural Analysis of Sr3NbFe3Si2O14 Single Crystal from the Langasite Family and Finding of Negative Thermal Expansion in the Range of 83–110 K
Creators
- 1. Russian Academy of Sciences, Shubnikov Institute of Crystallography, Federal Scientific Research Centre "Crystallography and Photonics," (Russian Federation)
- 2. National Research University MPEI (Russian Federation)
Description
Iron-containing Sr3NbFe3Si2O14 single crystals from the langasite family, which are interesting for researchers due to their magnetic ordering at TN = 26 K, have been grown by the floating zone melting method. Accurate X-ray diffraction analysis is performed at 293 and 90.5 K using the data collected on a CCD diffractometer. To compensate for systematic errors, two data sets are collected at each temperature. The structure is refined based on averaged data set: sp. gr. P321, Z = 1, sin θ/λ ≤ 1.35 Å–1; a = 8.2609(4) Å, c = 5.1313(3) Å at 293 K and a = 8.2344(6) Å, c = 5.1243(6) Å at 90.5 K; the agreement factors are R/wR = 1.18/1.03% and Δρmin/Δρmax =–0.57/0.25 e/Å3 for 3583 independent reflections at 293 K and R/wR = 1.18/1.13% and Δρmin/Δρmax =–0.54/0.23 e/Å3 for 3638 reflections at 90.5 K. Negative thermal expansion in the direction of the cell c axis is revealed in the range of 83–110 K.
Additional details
Identifiers
Publishing Information
- Journal Title
- Crystallography Reports
- Journal Volume
- 63
- Journal Issue
- 1
- Journal Page Range
- p. 37-44
- ISSN
- 1063-7745
- CODEN
- CYSTE3
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 50001145
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- CHARGE-COUPLED DEVICES; DIFFRACTOMETERS; ERRORS; IRON; MAGNETIZATION; MONOCRYSTALS; REFLECTION; STRONTIUM COMPOUNDS; TEMPERATURE RANGE 0065-0273 K; THERMAL EXPANSION; X-RAY DIFFRACTION; ZONE MELTING
- Descriptors DEC
- ALKALINE EARTH METAL COMPOUNDS; COHERENT SCATTERING; CRYSTAL GROWTH METHODS; CRYSTALS; DIFFRACTION; ELEMENTS; EXPANSION; MEASURING INSTRUMENTS; MELTING; METALS; PHASE TRANSFORMATIONS; SCATTERING; SEMICONDUCTOR DEVICES; TEMPERATURE RANGE; TRANSITION ELEMENTS
Optional Information
- Copyright
- Copyright (c) 2018 Pleiades Publishing, Inc.