Parallel upper critical field of niobium/graphite bilayers
- 1. Faculty of Science and Technology, Keio University, 3-14-1 Hiyoshi, Yokohama 223-8522 (Japan)
Description
The influence of the superconducting proximity effect to the upper critical field (HC) in niobium/graphite bilayers was studied and related to the ratio TC*/TCS: TC* and TCS are the transition temperature of Nb/KG film and that of Nb film respectively. The thickness of niobium (Nb) film was controlled about 40nm, and that of graphite (kish graphite: KG) film ranged from 120nm to 140nm. For making a specimen, Nb was deposited on a KG film and a quartz glass substrate simultaneously, and magnetic field was applied parallel to the Nb/KG interface. HC of Nb/KG film (HC*) lowered from that of Nb film (HCS) at all temperatures within this work, and the value of ΔHC defined as HCS-HC* showed different temperature dependence among samples, depending on whether TC*/TCS1.00< or-bar 1.00. This behavior of HC suggests the additional existence of the interference of electrons in the clean KG film
Additional details
Identifiers
- DOI
- 10.1016/j.physc.2005.01.010;
- PII
- S0921-4534(05)00041-9;
Publishing Information
- Journal Title
- Physica. C, Superconductivity
- Journal Volume
- 420
- Journal Issue
- 3-4
- Journal Page Range
- p. 78-82
- ISSN
- 0921-4534
- CODEN
- PHYCE6
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 37111785
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- CRITICAL FIELD; ELECTRONS; GRAPHITE; INTERFACES; INTERFERENCE; NIOBIUM; PROXIMITY EFFECT; QUARTZ; SUBSTRATES; SUPERCONDUCTING FILMS; SUPERCONDUCTORS; TEMPERATURE DEPENDENCE; THICKNESS; TRANSITION TEMPERATURE
- Descriptors DEC
- CARBON; DIMENSIONS; ELEMENTARY PARTICLES; ELEMENTS; FERMIONS; FILMS; LEPTONS; MAGNETIC FIELDS; METALS; MINERALS; NONMETALS; OXIDE MINERALS; PHYSICAL PROPERTIES; REFRACTORY METALS; THERMODYNAMIC PROPERTIES; TRANSITION ELEMENTS
Optional Information
- Copyright
- Copyright (c) 2005 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.