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Published July 2020 | Version v1
Journal article

Charge transport mechanism and percolation model in La0.75Ca0.25−xNaxMnO3 (0 ≤ x ≤ 0.10) manganites

  • 1. University of Sousse. Higher School of Science and Technology of Hammam Sousse (Tunisia)
  • 2. Faculté des Sciences de Monastir. Laboratoire de la Matière Condensée et des Nanosciences, Département de Physique (Tunisia)
  • 3. Université de Sfax. Laboratoire de Physique Appliquée, Faculté Des Sciences de Sfax (Tunisia)
  • 4. Shaqra University. Physics Department, Faculty of Science and Humanities in Ad-Dawadmi (Saudi Arabia)
  • 5. CNRS et Université Grenoble Alpes. Institut Néel (France)

Description

In this communication, La0.75Ca0.25−xNaxMnO3 (0 ≤ x ≤ 0.10) samples were synthesized by the Flux method and their structural and electrical properties were systematically undertaken. X-ray diffraction of the samples showed an orthorhombic structure with a Pbnm space group. Furthermore, to get a better understanding of the electrical properties, the resistivity ρ(T) as a function of temperature was measured by a standard four-probe method. The maximum resistivity values decreased and the insulator–metal transition temperature (TM–SC) increased with increasing magnetic field. At low-temperature region (T < TM–SC), ρ (T) was fitted by the equation ρ (T) = ρ0 + ρ2T2 + ρ4.5T4.5, which indicates that the transport mechanism is governed by a combination of electron–electron, electron–magnon, and electron–phonon scattering processes. Also, at the high-temperature (T > TM–SC) region, the transport mechanism was explained using the adiabatic small polaron hopping and the variable-range hopping models. Then, to get insights into the change in the resistivity plots, in entire temperature, ρ(T) was fitted by the percolation model. Interestingly, it is important to note that the activation energy (Ea) decreased with increasing Na+ content, which indicates the enhancement of the double-exchange (DE) interaction. Moreover the magnetoresistance (MR %) effect was studied.

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Publishing Information

Journal Title
Journal of Materials Science. Materials in Electronics
Journal Volume
31
Journal Issue
14
Journal Page Range
p. 11548-11559
ISSN
0957-4522
CODEN
JSMEEV

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Copyright (c) 2020 © Springer Science+Business Media, LLC, part of Springer Nature 2020